Fault testing for reversible circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 23, Issue 8, 2004, Pages 1220-1230

  Patel, Ketan N ^a,b   Hayes, John P ^a   Markov, Igor L ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

^b QUALCOMM INC   (United States)

Author keywords

Fault testing; Quantum computation; Reversible circuits

Indexed keywords

ALGORITHMS; CMOS INTEGRATED CIRCUITS; INTEGER PROGRAMMING; LINEAR PROGRAMMING; LOGIC GATES; MATHEMATICAL MODELS; POWER ELECTRONICS;

FAULT TESTING; QUANTUM COMPUTATION; REVERSIBLE CIRCUITS;

ELECTRIC FAULT CURRENTS;

EID: 3843147248     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2004.831576     Document Type: Article

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