Modeling QCA defects at molecular-level in combinational circuits

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2005, Pages 208-216

  Momenzadeh, Mariam ^a   Ottavi, Marco ^a   Lombardi, Fabrizio ^a  

^a Northeastern University   (United States)

Author keywords

Defect tolerance; Emerging technology; Fault model; QCA

Indexed keywords

DEFECT TOLERANCE; EMERGING TECHNOLOGY; FAULT MODEL; QCA;

AUTOMATA THEORY; COMPUTER SIMULATION; ELECTRIC INVERTERS; ELECTRIC WIRE; SEMICONDUCTOR QUANTUM DOTS;

COMBINATORIAL CIRCUITS;

EID: 28444469760     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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