Testing of quantum cellular automata

IEEE Transactions on Nanotechnology

Volumn 3, Issue 4, 2004, Pages 432-442

  Tahoori, Mehdi B ^a   Huang, Jing ^a   Momenzadeh, Mariam ^a   Lombardi, Fabrizio ^a  

^a Northeastern University   (United States)

Author keywords

Defect characterization; Design for testability; Nanotechnology; Quantum dot cellular automata (QCA); Testing

Indexed keywords

AUTOMATION; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; DEFECTS; NANOTECHNOLOGY; NATURAL FREQUENCIES; QUANTUM THEORY; VLSI CIRCUITS;

DEFECT CHARACTERIZATION; DESIGN-FOR-TESTABILITY; MAJORITY VOTER (MV); QUANTUM DOT CELLULAR AUTOMATA (QCA);

SEMICONDUCTOR QUANTUM DOTS;

EID: 10944262692     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2004.834169     Document Type: Article

References (20)

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