Defect characterization and tolerance of QCA sequential devices and circuits

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2005, Pages 199-207

  Momenzadeh, M ^a   Huang, J ^a   Lombardi, F ^a  

^a Northeastern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADIABATIC SWITCHING; DEFECT TOLERANCE; QUANTUM-DOT CELLULAR AUTOMATA (QCA); STUCK-AT-FAULTY;

AUTOMATA THEORY; COMPUTER SIMULATION; FLIP FLOP CIRCUITS; FORMAL LOGIC; NETWORKS (CIRCUITS); SCHEDULING; SEMICONDUCTOR QUANTUM DOTS;

SEQUENTIAL MACHINES;

EID: 28444457266     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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