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Volumn 15, Issue 10-12, 2009, Pages 269-273

Etching of Nb2O5 thin films by NbCl5

Author keywords

Etching; In situ; Mass spectrometry; Niobium oxide; QCM

Indexed keywords

IN-SITU; NIOBIUM OXIDES; NONUNIFORM; QUADRUPOLE MASS SPECTROMETER; THERMODYNAMIC DATA;

EID: 73949100837     PISSN: 09481907     EISSN: 15213862     Source Type: Journal    
DOI: 10.1002/cvde.200906795     Document Type: Article
Times cited : (26)

References (36)
  • 27
    • 73949109407 scopus 로고
    • U.S. Patent 4058430
    • T. Suntola, J. Antson, U.S. Patent 4058430 (1977).
    • (1977)
    • Suntola, T.1    Antson, J.2
  • 32
    • 73949098511 scopus 로고    scopus 로고
    • Outokumpu HSC Chemistry for Windows program package, Version 5.11 Outokumpu Research Oy, Pori, Finland, 2002
    • Outokumpu HSC Chemistry for Windows program package, Version 5.11 (Outokumpu Research Oy, Pori, Finland, 2002).
  • 33
    • 52649138379 scopus 로고    scopus 로고
    • and references therein
    • K. Knapas, M. Ritala, Chem. Mater. 2008, 20, 5698, and references therein.
    • (2008) Chem. Mater , vol.20 , pp. 5698
    • Knapas, K.1    Ritala, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.