-
1
-
-
35148872102
-
A reliable metric for mobility extraction of short-channel MOSFETs
-
Oct.
-
S. Severi, L. Pantisano, E. Augendre, E. San Andres, P. Eyben, and K. De Meyer, "A reliable metric for mobility extraction of short-channel MOSFETs," IEEE Trans. Electron Devices, vol.54, no.10, pp. 2690-2698, Oct. 2007.
-
(2007)
IEEE Trans. Electron Devices
, vol.54
, Issue.10
, pp. 2690-2698
-
-
Severi, S.1
Pantisano, L.2
Augendre, E.3
San Andres, E.4
Eyben, P.5
De Meyer, K.6
-
2
-
-
20244387715
-
Magnetoresistance mobility measurements in sub 0.1 μm Si MOSFETs
-
Y. Meziani, J. Lusakowski, F. Teppe, N. Dyakonova, W. Knap, K. Romanjek, M. Ferrier, R. Clerc, G. Ghibaudo, F. Boeuf, and T. Skotnicki, "Magnetoresistance mobility measurements in sub 0.1 μm Si MOSFETs," in Proc. 34th ESSDERC, 2004, pp. 157-160.
-
(2004)
Proc. 34th ESSDERC
, pp. 157-160
-
-
Meziani, Y.1
Lusakowski, J.2
Teppe, F.3
Dyakonova, N.4
Knap, W.5
Romanjek, K.6
Ferrier, M.7
Clerc, R.8
Ghibaudo, G.9
Boeuf, F.10
Skotnicki, T.11
-
3
-
-
46049114538
-
Unexpected mobility degradation for very short devices: A new challenge for CMOS scaling
-
A. Cros, K. Romanjek, D. Fleury, S. Harrison, R. Cerutti, P. Coronel, B. Dumont, A. Pouydebasque, R. Wacquez, B. Duriez, R. Gwoziecki, F. Boeuf, H. Brut, and G. Ghibaudo, "Unexpected mobility degradation for very short devices: A new challenge for CMOS scaling," in IEDM Tech. Dig., 2006, pp. 663-666.
-
(2006)
In IEDM Tech. Dig.
, pp. 663-666
-
-
Cros, A.1
Romanjek, K.2
Fleury, D.3
Harrison, S.4
Cerutti, R.5
Coronel, P.6
Dumont, B.7
Pouydebasque, A.8
Wacquez, R.9
Duriez, B.10
Gwoziecki, R.11
Boeuf, F.12
Brut, H.13
Ghibaudo, G.14
-
4
-
-
3142715886
-
Assessment of room-temperature phonon-limited mobility in gated silicon nanowires
-
Jun.
-
R. Kotlyar, B. Obradovic, P. Matagne, M. Stettler, and M. D. Giles, "Assessment of room-temperature phonon-limited mobility in gated silicon nanowires," Appl. Phys. Lett., vol.84, no.25, pp. 5270-5272, Jun. 2004.
-
(2004)
Appl. Phys. Lett.
, vol.84
, Issue.25
, pp. 5270-5272
-
-
Kotlyar, R.1
Obradovic, B.2
Matagne, P.3
Stettler, M.4
Giles, M.D.5
-
5
-
-
84893264597
-
Modeling of electron mobility in gated silicon nanowires at room temperature: Surface roughness, dielectric screening, and band nonparabolicity
-
Oct.
-
S. Jin, M. V. Fischetti, and T.-W. Tang, "Modeling of electron mobility in gated silicon nanowires at room temperature: Surface roughness, dielectric screening, and band nonparabolicity," J. Appl. Phys., vol.102, no.8, pp. 083715-1-083715-14, Oct. 2007.
-
(2007)
J. Appl. Phys.
, vol.102
, Issue.8
, pp. 0837151-08371514
-
-
Jin, S.1
Fischetti, M.V.2
Tang, T.-W.3
-
6
-
-
73349094111
-
Electron mobility in silicon nanowires
-
Jan.
-
E. B. Ramayya, D. Vasileska, S. M. Goodnick, and I. Knezevich, "Electron mobility in silicon nanowires," Appl. Phys. Lett., vol.6, no.1, p. 063711, Jan. 2007.
-
(2007)
Appl. Phys. Lett.
, vol.6
, Issue.1
, pp. 063711
-
-
Ramayya, E.B.1
Vasileska, D.2
Goodnick, S.M.3
Knezevich, I.4
-
7
-
-
54749158158
-
Electron transport in silicon nanowires: The role of acoustic phonon confinement and surface roughness scattering
-
Sep.
-
E. B. Ramayya, D. Vasileska, S. M. Goodnick, and I. Knezevich, "Electron transport in silicon nanowires: The role of acoustic phonon confinement and surface roughness scattering," J. Appl. Phys., vol.104, no.6, pp. 063711-1-063711-12, Sep. 2008.
-
(2008)
J. Appl. Phys
, vol.104
, Issue.6
, pp. 0637111-06371112
-
-
Ramayya, E.B.1
Vasileska, D.2
Goodnick, S.M.3
Knezevich, I.4
-
8
-
-
56549113551
-
Size dependence of surface-roughness-limited mobility in silicon nanowire FETs
-
Mar.
-
S. Poli, M. Pala, T. Poiroux, S. Deleonibus, and G. Baccarani, "Size dependence of surface-roughness-limited mobility in silicon nanowire FETs," IEEE Trans. Electron Devices, vol.55, no.11, pp. 2968-2976, Mar. 2008.
-
(2008)
IEEE Trans. Electron Devices
, vol.55
, Issue.11
, pp. 2968-2976
-
-
Poli, S.1
Pala, M.2
Poiroux, T.3
Deleonibus, S.4
Baccarani, G.5
-
9
-
-
67349258645
-
Full quantum treatment of remote Coulomb scattering in silicon nanowire FETs
-
Jun.
-
S. Poli, M. Pala, and T. Poiroux, "Full quantum treatment of remote Coulomb scattering in silicon nanowire FETs," IEEE Trans. Electron Devices, vol.56, no.6, pp. 1191-1198, Jun. 2009.
-
(2009)
IEEE Trans. Electron Devices
, vol.56
, Issue.6
, pp. 1191-1198
-
-
Poli, S.1
Pala, M.2
Poiroux, T.3
-
10
-
-
70350584509
-
Channel-length dependence of low-field mobility in silicon nanowire FETs
-
Nov.
-
S. Poli and M. G. Pala, "Channel-length dependence of low-field mobility in silicon nanowire FETs," IEEE Electron Device Lett., vol.30, no.11, pp. 1212-1214, Nov. 2009.
-
(2009)
IEEE Electron Device Lett
, vol.30
, Issue.11
, pp. 1212-1214
-
-
Poli, S.1
Pala, M.G.2
-
11
-
-
56549121570
-
Quasi-ballistic transport in nanowire field-effect transistors
-
Nov.
-
E. Gnani, A. Gnudi, S. Reggiani, and G. Baccarani, "Quasi-ballistic transport in nanowire field-effect transistors," IEEE Trans. Electron Devices, vol.55, no.11, pp. 2918-2930, Nov. 2008.
-
(2008)
IEEE Trans. Electron Devices
, vol.55
, Issue.11
, pp. 2918-2930
-
-
Gnani, E.1
Gnudi, A.2
Reggiani, S.3
Baccarani, G.4
-
12
-
-
56549087011
-
Experimental investigations on carrier transport in Si nanowire transistors: Ballistic efficiency and apparent mobility
-
Nov.
-
R. Wang, H. Liu, R. Huang, J. Zhuge, L. Zhang, D.-W. Kim, X. Zhang, D. Park, and Y.Wang, "Experimental investigations on carrier transport in Si nanowire transistors: Ballistic efficiency and apparent mobility," IEEE Trans. Electron Devices, vol.55, no.11, pp. 2960-2967, Nov. 2008.
-
(2008)
IEEE Trans. Electron Devices
, vol.55
, Issue.11
, pp. 2960-2967
-
-
Wang, R.1
Liu, H.2
Huang, R.3
Zhuge, J.4
Zhang, L.5
Kim, D.-W.6
Zhang, X.7
Park, D.8
Wang, Y.9
-
13
-
-
0001851579
-
Alternative approach to the solution of added carrier transport problems in semiconductors
-
Jul.
-
J. P. McKelvey, R. L. Longini, and T. P. Brody, "Alternative approach to the solution of added carrier transport problems in semiconductors," Phys. Rev., vol.123, no.1, pp. 51-57, Jul. 1961.
-
(1961)
Phys. Rev
, vol.123
, Issue.1
, pp. 51-57
-
-
McKelvey, J.P.1
Longini, R.L.2
Brody, T.P.3
-
14
-
-
0036713397
-
Low ballistic mobility in submicron HEMTs
-
Sep.
-
M. Shur, "Low ballistic mobility in submicron HEMTs," IEEE Electron Device Lett., vol.23, no.9, pp. 511-513, Sep. 2002.
-
(2002)
IEEE Electron Device Lett
, vol.23
, Issue.9
, pp. 511-513
-
-
Shur, M.1
-
15
-
-
41749110294
-
Theoretical study of some physical aspects of electronic transport in MOSFETs at the 10-nm gate length
-
Sep.
-
M. V. Fischetti, T. P. O'Regan, S. Narayanan, C. Sachs, S. Jin, J. Kim, and Y. Zhang, "Theoretical study of some physical aspects of electronic transport in MOSFETs at the 10-nm gate length," IEEE Trans. Electron Devices, vol.54, no.9, pp. 2116-2136, Sep. 2007.
-
(2007)
IEEE Trans. Electron Devices
, vol.54
, Issue.9
, pp. 2116-2136
-
-
Fischetti, M.V.1
O'regan, T.P.2
Narayanan, S.3
Sachs, C.4
Jin, S.5
Kim, J.6
Zhang, Y.7
-
16
-
-
70350234811
-
Scaling MOSFETs to 10 nm: Coulomb effects, source starvation, and virtual source
-
M. V. Fischetti, S. Jin, T.-W. Tang, P. Asbeck, Y. Taur, S. E. Laux, and N. Sano, "Scaling MOSFETs to 10 nm: Coulomb effects, source starvation, and virtual source," in Proc. 13th IWCE Dig. Tech. Papers, 2009, pp. 111-116.
-
(2009)
In Proc. 13th IWCE Dig. Tech. Papers
, pp. 111-116
-
-
Fischetti, M.V.1
Jin, S.2
Tang, T.-W.3
Asbeck, P.4
Taur, Y.5
Laux, S.E.6
Sano, N.7
-
17
-
-
0028747841
-
On the universality of inversion layer mobility in Si MOSFETs: Part I-Effects of substrate impurity concentration
-
Dec.
-
S. Takagi, A. Toriumi, M. Iwase, and H. Tango, "On the universality of inversion layer mobility in Si MOSFETs: Part I-Effects of substrate impurity concentration," IEEE Trans. Electron Devices, vol.41, no.12, pp. 2357-2362, Dec. 1994.
-
(1994)
IEEE Trans. Electron Devices
, vol.41
, Issue.12
, pp. 2357-2362
-
-
Takagi, S.1
Toriumi, A.2
Iwase, M.3
Tango, H.4
-
18
-
-
50949116543
-
Semiclassical transport in silicon nanowire FETs including surface roughness
-
Sep. [Online]. Available:
-
M. Lenzi, A. Gnudi, S. Reggiani, E. Gnani, M. Rudan, and G. Baccarani. (2008, Sep.). Semiclassical transport in silicon nanowire FETs including surface roughness. J. Comput. Electron. [Online]. 7(3), pp. 355-358. Available: www.springerlink.com
-
(2008)
J. Comput. Electron.
, vol.7
, Issue.3
, pp. 355-358
-
-
Lenzi, M.1
Gnudi, A.2
Reggiani, S.3
Gnani, E.4
Rudan, M.5
Baccarani, G.6
-
19
-
-
49249122744
-
Investigation of the transport properties of silicon nanowires using deterministic and Monte Carlo approaches to the solution of the Boltzmann transport equation
-
Aug.
-
M. Lenzi, P. Palestri, E. Gnani, S. Reggiani, A. Gnudi, D. Esseni, L. Selmi, and G. Baccarani, "Investigation of the transport properties of silicon nanowires using deterministic and Monte Carlo approaches to the solution of the Boltzmann transport equation," IEEE Trans. Electron Devices, vol.55, no.8, pp. 2086-2096, Aug. 2008.
-
(2008)
IEEE Trans. Electron Devices
, vol.55
, Issue.8
, pp. 2086-2096
-
-
Lenzi, M.1
Palestri, P.2
Gnani, E.3
Reggiani, S.4
Gnudi, A.5
Esseni, D.6
Selmi, L.7
Baccarani, G.8
|