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Volumn , Issue , 2009, Pages

State of the art and the future of wide band-gap devices

Author keywords

Bipolar device; Diamond; Freewheel diode; High power discrete device; IGBT; JFET; MOSFET; Packaging; Power semiconductor device; Semiconductor material; SiC device; Silicon carbide; Super junction device; Thyristor; Transistor

Indexed keywords

BIPOLAR DEVICE; DISCRETE DEVICES; HIGH-POWER; JFET; MOS-FET; POWER SEMICONDUCTOR DEVICES; SIC-DEVICE; SUPER JUNCTION DEVICE; SUPER JUNCTIONS;

EID: 72949084854     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (142)

References (31)
  • 2
    • 72949098681 scopus 로고    scopus 로고
    • rd 2009
    • rd 2009
  • 3
    • 72949122871 scopus 로고    scopus 로고
    • Velox Semiconductor Corp., application note #002, Performance comparison of the power supplies with GaN diodes and with SiC diodes on www.veloxsemi.com, 2006
    • Velox Semiconductor Corp., application note #002, "Performance comparison of the power supplies with GaN diodes and with SiC diodes" on www.veloxsemi.com, 2006
  • 4
    • 72949116645 scopus 로고    scopus 로고
    • GaN Schottky barrier diodes threaten to overturn SiC
    • April
    • M. Murphy, L. Liu, M. Pophristic, B. Peres, "GaN Schottky barrier diodes threaten to overturn SiC" in Compound Semiconductor, Vol. 14, No. 3, pp. 18-20, April 2008
    • (2008) Compound Semiconductor , vol.14 , Issue.3 , pp. 18-20
    • Murphy, M.1    Liu, L.2    Pophristic, M.3    Peres, B.4
  • 5
    • 84857510180 scopus 로고    scopus 로고
    • GaN Based Power Devices: Cost-Effective Revolutionary Performance
    • M. A. Briere, "GaN Based Power Devices: Cost-Effective Revolutionary Performance", Power Electronics Europe, Issue 7, 2008
    • (2008) Power Electronics Europe , Issue.7
    • Briere, M.A.1
  • 6
    • 72949099126 scopus 로고    scopus 로고
    • th 2008
    • th 2008
  • 7
    • 84879357567 scopus 로고    scopus 로고
    • GaN Based Power Technology Stimulates Revolution in Conversion Electronics
    • April 2009
    • T. McDonald, "GaN Based Power Technology Stimulates Revolution in Conversion Electronics", Bodo's Power Systems (www.bodospower.com), April 2009
    • Bodo's Power Systems
    • McDonald, T.1
  • 8
    • 72949085614 scopus 로고    scopus 로고
    • th 2009
    • th 2009
  • 9
    • 49249138716 scopus 로고    scopus 로고
    • Performance and Stability of Large-Area 4H-SiC 10-kV Junction Barrier Schottky-Rectifiers
    • August
    • B. A. Hull et al., "Performance and Stability of Large-Area 4H-SiC 10-kV Junction Barrier Schottky-Rectifiers", IEEE Trans. on El. Dev., Vol. 55, No. 8, pp. 1864-1870, August 2008
    • (2008) IEEE Trans. on El. Dev , vol.55 , Issue.8 , pp. 1864-1870
    • Hull, B.A.1
  • 10
    • 67650436878 scopus 로고    scopus 로고
    • SiC-Powerdiodes: Design and Performance
    • paper #0636, Aalborg, September
    • W. Bartsch et al., "SiC-Powerdiodes: Design and Performance", Proceedings of the EPE2007, paper #0636, Aalborg, September 2007
    • (2007) Proceedings of the EPE2007
    • Bartsch, W.1
  • 11
    • 49249106389 scopus 로고    scopus 로고
    • A 10-kV Large-Area 4H-SiC Power DMOSFET With Stable Subthreshold Behavior Independent of Temperature
    • August
    • R. S. Howell et al., "A 10-kV Large-Area 4H-SiC Power DMOSFET With Stable Subthreshold Behavior Independent of Temperature", IEEE Trans. on El. Dev., Vol. 55, No. 8, pp. 1807-1815, August 2008
    • (2008) IEEE Trans. on El. Dev , vol.55 , Issue.8 , pp. 1807-1815
    • Howell, R.S.1
  • 12
    • 49249116009 scopus 로고    scopus 로고
    • DC and Transient Performance of 4H-SiC Double-Implanted MOSFETs
    • August
    • P. A. Losee et al., "DC and Transient Performance of 4H-SiC Double-Implanted MOSFETs", IEEE Trans. on El. Dev., Vol. 55, No. 8, pp. 1824-1829, August 2008
    • (2008) IEEE Trans. on El. Dev , vol.55 , Issue.8 , pp. 1824-1829
    • Losee, P.A.1
  • 13
    • 49249127804 scopus 로고    scopus 로고
    • 2 1650-V Normally on 4H-SiC TI-VJFET
    • August
    • 2 1650-V Normally on 4H-SiC TI-VJFET", IEEE Trans. on El. Dev., Vol. 55, No. 8, pp. 1880-1886, August 2008
    • (2008) IEEE Trans. on El. Dev , vol.55 , Issue.8 , pp. 1880-1886
    • Losee, P.A.1
  • 14
    • 57049174467 scopus 로고    scopus 로고
    • 2 Active Area and Blocking-Voltage Capability Reaching the Material Limit
    • December
    • 2 Active Area and Blocking-Voltage Capability Reaching the Material Limit", IEEE El. Dev. Letters, Vol. 29, No. 12, pp. 1325-1327, December 2008
    • (2008) IEEE El. Dev. Letters , vol.29 , Issue.12 , pp. 1325-1327
    • Veliadis, V.1
  • 15
    • 72949087181 scopus 로고    scopus 로고
    • 2 1.9kV Enhancement-Mode SiC VJFETs
    • Barcelona, June
    • st ISPSD, pp. 335-338, Barcelona, June 2009
    • (2009) st ISPSD , pp. 335-338
    • Sheridan, D.C.1
  • 16
    • 49249139436 scopus 로고    scopus 로고
    • 3 and SiC
    • August
    • 3 and SiC", IEEE Trans. on El. Dev., Vol. 55, No. 8, pp. 2041-2045, August 2008
    • (2008) IEEE Trans. on El. Dev , vol.55 , Issue.8 , pp. 2041-2045
    • Hatayama, T.1
  • 17
    • 49349084034 scopus 로고    scopus 로고
    • Characterization of Transient Gate Oxide Trapping in SiC MOSFETs Using Fast I-V Techniques
    • August
    • M. Gurfinkel et al., "Characterization of Transient Gate Oxide Trapping in SiC MOSFETs Using Fast I-V Techniques", IEEE Trans. on El. Dev., Vol. 55, No. 8, pp. 2004-2012, August 2008
    • (2008) IEEE Trans. on El. Dev , vol.55 , Issue.8 , pp. 2004-2012
    • Gurfinkel, M.1
  • 18
    • 72949101855 scopus 로고    scopus 로고
    • Enhancement-mode GaN Hybrid MOS-HFETs on Si substrates with over 70 A operation
    • Barcelona, June
    • st ISPSD, pp. 21-24, Barcelona, June 2009
    • (2009) st ISPSD , pp. 21-24
    • Kambayashi, H.1
  • 19
    • 72949110662 scopus 로고    scopus 로고
    • x gate with Recess
    • Barcelona, June
    • st ISPSD, pp. 25-28, Barcelona, June 2009
    • (2009) st ISPSD , pp. 25-28
    • Kaneko, N.1
  • 20
    • 49249123302 scopus 로고    scopus 로고
    • Theoretical and Experimental Analyses of Safe Operating Area (SOA) of 1200-V 4H-SiC BJT
    • August
    • Y. Gao et al., "Theoretical and Experimental Analyses of Safe Operating Area (SOA) of 1200-V 4H-SiC BJT", IEEE Trans. on El. Dev., Vol. 55, No. 8, pp. 1887-1893, August 2008
    • (2008) IEEE Trans. on El. Dev , vol.55 , Issue.8 , pp. 1887-1893
    • Gao, Y.1
  • 21
    • 49249108274 scopus 로고    scopus 로고
    • High-Current-Gain SiC BJTs With Regrown Extrinsic Base and Etched JTE
    • August
    • H. S. Lee et al., "High-Current-Gain SiC BJTs With Regrown Extrinsic Base and Etched JTE", IEEE Trans. on El. Dev., Vol. 55, No. 8, pp. 1894-1898, August 2008
    • (2008) IEEE Trans. on El. Dev , vol.55 , Issue.8 , pp. 1894-1898
    • Lee, H.S.1
  • 22
    • 49249128100 scopus 로고    scopus 로고
    • Fabrication and Characterization of High-Current-Gain 4H-SiC Bipolar Junction Transistors
    • August
    • J. H. Zhang et al., "Fabrication and Characterization of High-Current-Gain 4H-SiC Bipolar Junction Transistors", IEEE Trans. on El. Dev., Vol. 55, No. 8, pp. 1899-1906, August 2008
    • (2008) IEEE Trans. on El. Dev , vol.55 , Issue.8 , pp. 1899-1906
    • Zhang, J.H.1
  • 23
    • 54849362500 scopus 로고    scopus 로고
    • 2 Non Ion-Implanted 4H-SiC BJTs With Common-Emitter Current Gain of 50
    • October
    • 2 Non Ion-Implanted 4H-SiC BJTs With Common-Emitter Current Gain of 50", IEEE El. Dev. Letters, Vol. 29, No. 10, pp. 1135-1137, October 2008
    • (2008) IEEE El. Dev. Letters , vol.29 , Issue.10 , pp. 1135-1137
    • Ghandi, R.1
  • 24
    • 57149145664 scopus 로고    scopus 로고
    • High- Voltage 4H-SiC Bipolar Junction Transistors With Epitaxial Regrowth of the Base Contact
    • December
    • S. Sharma, C. Li, I. B. Bhat, T. P. Chow, "High- Voltage 4H-SiC Bipolar Junction Transistors With Epitaxial Regrowth of the Base Contact", IEEE Trans. on El. Dev., Vol. 55, No. 12, pp. 3360-3366, December 2008
    • (2008) IEEE Trans. on El. Dev , vol.55 , Issue.12 , pp. 3360-3366
    • Sharma, S.1    Li, C.2    Bhat, I.B.3    Chow, T.P.4
  • 25
    • 59649115833 scopus 로고    scopus 로고
    • forced of 336 in 4H-SiC
    • February
    • forced of 336 in 4H-SiC", IEEE El. Dev. Letters, Vol. 30, No. 2, pp. 142-143, February 2009
    • (2009) IEEE El. Dev. Letters , vol.30 , Issue.2 , pp. 142-143
    • Zhang, Q.C.1
  • 26
    • 70350003250 scopus 로고    scopus 로고
    • A New High Current Gain 4H-SiC Bipolar Junction Transistor with Suppressed Surface Recombination Structure: SSR-BJT
    • Barcelona, and Material Science Forum, Vols, March
    • K. Nonaka et al., "A New High Current Gain 4H-SiC Bipolar Junction Transistor with Suppressed Surface Recombination Structure: SSR-BJT", Proceedings of the ECSCRM 2008, Barcelona, and Material Science Forum, Vols. 615-617, pp. 821-824, March 2009
    • (2008) Proceedings of the ECSCRM , vol.615-617 , pp. 821-824
    • Nonaka, K.1
  • 27
    • 72949098378 scopus 로고    scopus 로고
    • 4H-SiC Bipolar Junction Transistors: From Research to Development - A Case Study: 1200 V, 20 A Stable SiC BJTs with High Blocking Yield
    • Barcelona, June
    • st ISPSD, pp. 339-342, Barcelona, June 2009
    • (2009) st ISPSD , pp. 339-342
    • Zhang, Q.C.1
  • 28
    • 49249132914 scopus 로고    scopus 로고
    • Design and Characterisation of High-Voltage 4H-SiC p-IGBTs
    • August
    • Q. C. Zhang et al., "Design and Characterisation of High-Voltage 4H-SiC p-IGBTs", IEEE Trans. on El. Dev., Vol. 55, No. 8, pp. 1912-1919, August 2008
    • (2008) IEEE Trans. on El. Dev , vol.55 , Issue.8 , pp. 1912-1919
    • Zhang, Q.C.1
  • 29
    • 50649111436 scopus 로고    scopus 로고
    • 12-kV p-Channel IGBTs With Low On-Resistance in 4H-SiC
    • September
    • Q. C. Zhang et al., "12-kV p-Channel IGBTs With Low On-Resistance in 4H-SiC", IEEE El. Dev. Letters, Vol. 29, No. 9, pp. 1027-1029, September 2008
    • (2008) IEEE El. Dev. Letters , vol.29 , Issue.9 , pp. 1027-1029
    • Zhang, Q.C.1
  • 30
    • 8644290138 scopus 로고    scopus 로고
    • BIFET - a novel bipolar SiC switch for high voltage power electronics
    • Lyon, and Material Science Forum, Vols, June
    • H. Mitlehner et al., "BIFET - a novel bipolar SiC switch for high voltage power electronics", Proceedings of the ECSCRM 2003, Lyon, and Material Science Forum, Vols. 457-460, pp. 1245-1248, June 2004
    • (2003) Proceedings of the ECSCRM , vol.457-460 , pp. 1245-1248
    • Mitlehner, H.1
  • 31
    • 72949115788 scopus 로고    scopus 로고
    • Infineon Technologies AG, application note CoolMOS™ 900V V1.3 on www.infineon.com, May 2008
    • Infineon Technologies AG, application note "CoolMOS™ 900V" V1.3 on www.infineon.com, May 2008


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.