A comparison of control architectures for atomic force microscopes

Asian Journal of Control

Volumn 11, Issue 2, 2009, Pages 175-181

  Butterworth, J A ^a   Pao, L Y ^a   Abramovitch, D Y ^b  

^a University of Colorado   (United States)

^b AGILENT LABORATORIES   (United States)

Author keywords

Atomic force microscope; Feedforward control

Indexed keywords

ATOMIC FORCE MICROSCOPY; FEEDFORWARD CONTROL; MICROSCOPES;

CLOSED LOOPS; CONTROL ARCHITECTURE; FEED-BACK LOOP; FEEDBACK CONTROLLER; FEEDFORWARD FILTERS; RASTER SCANS; REFERENCE INPUTS; TRACKING PERFORMANCE;

FEEDBACK;

EID: 72449146195     PISSN: 15618625     EISSN: None     Source Type: Journal    
DOI: 10.1002/asjc.93     Document Type: Article

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