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Journal of Applied Physics

Volumn 106, Issue 10, 2009, Pages

Molecular structure of extended defects in monolayer-scale pentacene thin films

(2) Seo, S a Evans, P G a

a University of Wisconsin Madison (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHIC DIRECTIONS; EXTENDED DEFECT; IN-PLANE; INSULATING SUBSTRATES; LOW ENERGIES; MOLECULAR LAYER; MOLECULAR SCALE STRUCTURES; ORGANIC ELECTRONIC DEVICES; PENTACENE FILM; PENTACENE THIN FILMS; PENTACENES; SCANNING TUNNELING MICROSCOPY (STM); SI(001) SURFACES; STM IMAGES; STM STUDY; STRUCTURAL DEFECT; SURFACE NORMALS; TILT GRAIN BOUNDARY; TRAP STATE; TWIST BOUNDARIES;

CONDUCTIVE FILMS; FILM GROWTH; GRAIN BOUNDARIES; GRAIN GROWTH; GRAIN SIZE AND SHAPE; MONOLAYERS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING ORGANIC COMPOUNDS; SEMICONDUCTING SILICON COMPOUNDS; STYRENE; THIN FILM DEVICES; THIN FILM TRANSISTORS; THIN FILMS;

STACKING FAULTS;

EID: 71749112755 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3262618 Document Type: Article

Times cited : (14)

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