Novel application of focused ion beam electron microscopy (FIB-EM) in preparation and analysis of microfossil ultrastructures: A new view of complexity in early eukaryotic organisms

Palaios

Volumn 24, Issue 9, 2009, Pages 616-626

  Schiffbauer, James D ^a   Xiao, Shuhai ^a  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

Author keywords

acritarch; focused ion beam electron microscopy; nanotomography; sequential ion sectioning; ultrastructure

Indexed keywords

ACRITARCH; DEPOSITION; ELECTRON MICROSCOPY; EUKARYOTE; INSULATION; ION; METAL; MICROFOSSIL; MINERAL; PALEOENVIRONMENT; PROTEROZOIC; RESOLUTION; SCANNING ELECTRON MICROSCOPY; THREE-DIMENSIONAL MODELING; TOMOGRAPHY; ULTRASTRUCTURE;

CHINA; HENAN; RUYANG;

ACRITARCHA; EUKARYOTA;

EID: 70450246636     PISSN: 08831351     EISSN: None     Source Type: Journal    
DOI: 10.2110/palo.2009.p09-003r     Document Type: Article

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