ESD protection for advanced CMOS SOI technologies

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 2005, Pages

  Khazhinsky, Michael G ^a   Stockinger, Michael ^a   Miller, James W ^a   Weldon, James C ^a  

^a FREESCALE SEMICONDUCTOR INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADVANCED CMOS; BULK DEVICES; CIRCUIT LEVELS; DESIGN METHODOLOGY; DEVICE SIZES; ESD PROTECTION; ESD STRESS; RESPONSE SURFACE METHOD; SOI-MOSFETS; SPICE SIMULATIONS; TEST CIRCUIT; TEST DATA; TEST RESULTS;

ELECTROSTATIC DEVICES; ELECTROSTATIC DISCHARGE; SIMULATORS;

SPICE;

EID: 70449724917     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (25)

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