Prediction of ESD protection levels and novel protection devices in thin film SOI technology

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1997, Pages 356-365

  Raha, Prasun ^a   Smith, Jeremy C ^a   Miller, James W ^a   Rosenbaum, Elyse ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION IN SOLIDS; ELECTRIC DISCHARGES; ELECTROSTATICS; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MODELS; SILICON ON INSULATOR TECHNOLOGY; THIN FILMS;

ELECTROSTATIC DISCHARGE (ESD); HUMAN BODY MODELS (HBM);

MOSFET DEVICES;

EID: 0031336339     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)