Silicon-on-insulator dynamic threshold ESD networks and active clamp circuitry

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 2000, Pages 29-40

  Voldman, S ^a   Hui, D ^a   Young, D ^a   Williams, R ^a   Dreps, D ^a   Howard, J ^a   Sherony, M ^a   Assaderaghi, F ^a   Shahidi, G ^a  

^a IBM RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE NETWORKS; CMOS INTEGRATED CIRCUITS; ELECTRIC EQUIPMENT PROTECTION; ELECTRIC INSULATORS; MICROPROCESSOR CHIPS; MOSFET DEVICES; SILICON; SILICON ON INSULATOR TECHNOLOGY;

ELECTROSTATIC DISCHARGE NETWORKS;

ELECTROSTATIC DEVICES;

EID: 0034542546     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (24)