Built-in aging monitoring for safety-critical applications

2009 15th IEEE International On-Line Testing Symposium, IOLTS 2009

Volumn , Issue , 2009, Pages 9-14

  Vazquez, J C ^a,b   Champac, V ^b   Ziesemer Jr , A M ^a,c   Reis, R ^c   Teixeira, I C ^a,d   Santos, M B ^a,d   Teixeira, J P ^a,d  

^a INESC ID   (Portugal)

^b INSTITUTO NACIONAL DE ASTROFÍSICA   (Mexico)

^c FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

^d INSTITUTO SUPERIOR TÉCNICO   (Portugal)

Author keywords

Aging sensors; Delay testing; Failure prediction; Reliability in nanometer technologies

Indexed keywords

AGING MONITORING; AGING SENSORS; COMPLEX ELECTRONIC SYSTEMS; DELAY TESTING; DEVICE-SCALING; DIGITAL SYSTEM; ELECTRONIC SYSTEMS; FAILURE PREDICTION; HARSH ENVIRONMENT; LONG TERM PERFORMANCE; MISSION CRITICAL APPLICATIONS; NOVEL METHODOLOGY; ON CHIPS; POWER SUPPLY VOLTAGE; QUALITY REQUIREMENTS; SAFE OPERATION; SAFETY CRITICAL APPLICATIONS; SIMULATION RESULT; TEMPERATURE VARIATION;

AUTOMOBILE ELECTRONIC EQUIPMENT; DEGRADATION; ELECTRONICS ENGINEERING; RELIABILITY; SENSORS;

PREVENTIVE MAINTENANCE;

EID: 70449455921     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IOLTS.2009.5195976     Document Type: Conference Paper

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