ATPG-based grading of strong fault-secureness

2009 15th IEEE International On-Line Testing Symposium, IOLTS 2009

Volumn , Issue , 2009, Pages 269-274

  Hunger, Marc ^a   Hellebrand, Sybille ^a   Czutro, Alejandro ^b   Polian, Ilia ^b   Becker, Bernd ^b  

^a UNIVERSITY OF PADERBORN   (Germany)

^b UNIVERSITY OF FREIBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT DESIGNS; COMPLEX ANALYSIS; DESIGN VALIDATION; DETECTABILITY; FAULT SEQUENCES; MULTIPLE FAULTS; NANOSCALE TECHNOLOGIES; REDUNDANCY INFORMATION; ROBUSTNESS PROPERTIES; SELF CHECKING; SINGLE FAULT; SPEED-UPS;

INTEGRATED CIRCUIT MANUFACTURE; NANOTECHNOLOGY;

ELECTRIC NETWORK ANALYSIS;

EID: 70449389987     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IOLTS.2009.5196027     Document Type: Conference Paper

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