Self-checking ALU design with efficient codes

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1996, Pages 157-161

  Gorshe, Steven S ^a   Bose, Bella ^a  

^a NEC Corporation of America   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; BINARY CODES; ERROR DETECTION; FAILURE ANALYSIS; INTEGRATED CIRCUIT TESTING;

ARITHMETIC LOGIC UNIT; BERGER CODES; INFORMATION BITS; INPUT OPERAND CHECK VALUES; SELF TESTING ALU DESIGN; UNIDIRECTIONAL ERRORS;

COMPUTER AIDED LOGIC DESIGN;

EID: 0029716420     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)