Probability to achieve TSC goal

IEEE Transactions on Computers

Volumn 45, Issue 4, 1996, Pages 450-460

  Lo, Jien Chung ^a   Fujiwara, Eiji ^b  

^a The University of Rhode Island   (United States)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Concurrent error detection; Embedded circuits; Error control coding; Failure rate; Fault modeling; Physical layout for testability; Probabilistic measure

Indexed keywords

EID: 0000986545     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.494102     Document Type: Article

References (20)

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