On-line testing for VLSI - A compendium of approaches

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 12, Issue 1-2, 1998, Pages 7-20

  Nicolaidis, M ^a   Zorian, Y ^b  

^a TIMA LABORATORY   (France)

^b LogicVision Inc   (United States)

Author keywords

Current monitors; Fail safe circuits; Monitoring of reliability indicators; On line testing; Radiation monitors; Self checking circuits; SEU hardened circuits; Thermal monitors

Indexed keywords

DETECTOR CIRCUITS; ERROR DETECTION; ONLINE SYSTEMS; VLSI CIRCUITS;

FAIL SAFE CIRCUITS; ONLINE TESTING; SELF CHECKING CIRCUITS;

INTEGRATED CIRCUIT TESTING;

EID: 0031997667     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1008244815697     Document Type: Article

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