Accurate product lifetime predictions based on device-level measurements

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2009, Pages 634-639

  Nigam, T ^a   Parameshwaran, B ^a   Krause, G ^b  

^a ADVANCED MICRO DEVICES   (United States)

^b AMD Fab36 ^*  (Germany)

Author keywords

HCI; Product degradation; Ring oscillators

Indexed keywords

DEGRADATION MODEL; HCI; PRODUCT DEGRADATION; PRODUCT LIFE; PRODUCT LIFETIME; RING OSCILLATOR; RING OSCILLATORS;

CHOPPERS (CIRCUITS); ELECTRIC CURRENTS; ELECTRIC SWITCHGEAR; OSCILLATORS (ELECTRONIC);

DEGRADATION;

EID: 70449107002     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2009.5173322     Document Type: Conference Paper

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