Scanning tunneling microscopy with single crystalline W[001] tips: High resolution studies of Si (557) 5×5 surface

Applied Physics Letters

Volumn 95, Issue 17, 2009, Pages

  Chaika, A N ^a   Semenov, V N ^a   Glebovskiy, V G ^a   Bozhko, S I ^a,b  

^a INSTITUTE OF SOLID STATE PHYSICS   (Russian Federation)

^b NT MDT   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC STRUCTURE; CRYSTALLOGRAPHIC ORIENTATIONS; HIGH RESOLUTION; HIGH RESOLUTION SCANNING TUNNELING MICROSCOPY; HIGH STABILITY; NONIDEAL; PROBE GEOMETRY; SI (1 1 1); SINGLE-CRYSTALLINE; TUNGSTEN TIP; TUNNELING PARAMETER;

CRYSTAL ATOMIC STRUCTURE; CRYSTALLINE MATERIALS; IMAGE RECONSTRUCTION; SILICON; SOIL CONSERVATION; TUNGSTEN; WIND TUNNELS;

SCANNING TUNNELING MICROSCOPY;

EID: 70350714193     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3254240     Document Type: Article

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