New method for imaging atoms

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 18, Issue 6, 2000, Pages 2681-2683

  Dou, Juying ^a,b   Chen, Ergang ^b   Zhu, Changchun ^a   Yang, Deqing ^b  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b YUNNAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; IMAGE ANALYSIS; OPTICAL RESOLVING POWER;

HIGH RESOLUTION THERMAL FIELD EMISSION MICROSCOPE (HRTFEM);

FIELD EMISSION MICROSCOPES;

EID: 0034316429     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1318191     Document Type: Article

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