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Volumn 19, Issue 11, 2009, Pages

Nano-depth grooves formed through O2 plasma etching in the presence of PTFE

Author keywords

[No Author keywords available]

Indexed keywords

ETCHING CHAMBER; ETCHING RATE; FLUIDIC CHANNELS; GLASS SURFACES; OUTPUT POWER; PLASMA EQUIPMENTS; ROOT MEAN SQUARE ROUGHNESS; SILICON SUBSTRATES; SIMPLE METHOD; SURFACE AREA;

EID: 70350647353     PISSN: 09601317     EISSN: 13616439     Source Type: Journal    
DOI: 10.1088/0960-1317/19/11/115032     Document Type: Article
Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.