Individual GaAs nanorods imaged by coherent X-ray diffraction

Journal of Synchrotron Radiation

Volumn 16, Issue 6, 2009, Pages 796-802

  Biermanns, Andreas ^a   Davydok, Anton ^a   Paetzelt, Hendrik ^b,c   Diaz, Ana ^d   Gottschalch, Volker ^c   Metzger, Till Hartmut ^d   Pietsch, Ullrich ^a  

^a UNIVERSITY OF SIEGEN   (Germany)

^b LEIBNIZ INSTITUTE OF SURFACE ENGINEERING IOM   (Germany)

^c UNIVERSITY OF LEIPZIG   (Germany)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Coherent diffraction imaging; Phase retrieval analysis; Semiconductor nanorods; X ray diffraction

Indexed keywords

A-SPOTS; CIRCULAR OPENING; COHERENT DIFFRACTION IMAGING; COHERENT X-RAY DIFFRACTION; GAAS; NANORODS GROWN; PERIODIC ARRAYS; PHASE-RETRIEVAL ANALYSIS; SEMICONDUCTOR NANORODS; STRAIN STATE; X RAY BEAM; X-RAY DIFFRACTION MICROSCOPY;

DIFFRACTION; GALLIUM ALLOYS; NANORODS; SEMICONDUCTING GALLIUM; SILICON NITRIDE; X RAY DIFFRACTION; X RAY OPTICS; X RAYS;

X RAY DIFFRACTION ANALYSIS;

EID: 70350327165     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049509032889     Document Type: Conference Paper

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