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Volumn 486, Issue 1-2, 2009, Pages 474-479
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Evolutions of the interface and shear strength between SnAgCu-xNi solder and Cu substrate during isothermal aging at 150 °C
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Author keywords
Composite solders; Intermetallics (IM); Microstructure; Scanning electron microscopy (SEM); Sn3.8Ag0.7Cu
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Indexed keywords
AGING TIME;
BALL-SHEAR TEST;
BULK SOLDER;
COMPOSITE JOINT;
COMPOSITE SOLDERS;
CU SUBSTRATE;
DIFFUSION COUPLE;
FRACTURE MODE;
IMC LAYER;
INTERMETALLIC COMPOUNDS;
ISOTHERMAL AGING;
MIXED TYPE;
NI PARTICLES;
NON-COMPOSITE;
ORGANIC SOLDERABILITY PRESERVATIVE;
SN3.8AG0.7CU;
SOLDER JOINTS;
SQUARE ROOTS;
DUCTILE FRACTURE;
JOINTS (STRUCTURAL COMPONENTS);
MICROSTRUCTURE;
NICKEL;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING INTERMETALLICS;
SHEAR STRENGTH;
SOLDERING ALLOYS;
SUBSTRATES;
TIN;
BRITTLE FRACTURE;
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EID: 70350126964
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2009.06.171 Document Type: Article |
Times cited : (81)
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References (18)
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