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Volumn 486, Issue 1-2, 2009, Pages 474-479

Evolutions of the interface and shear strength between SnAgCu-xNi solder and Cu substrate during isothermal aging at 150 °C

Author keywords

Composite solders; Intermetallics (IM); Microstructure; Scanning electron microscopy (SEM); Sn3.8Ag0.7Cu

Indexed keywords

AGING TIME; BALL-SHEAR TEST; BULK SOLDER; COMPOSITE JOINT; COMPOSITE SOLDERS; CU SUBSTRATE; DIFFUSION COUPLE; FRACTURE MODE; IMC LAYER; INTERMETALLIC COMPOUNDS; ISOTHERMAL AGING; MIXED TYPE; NI PARTICLES; NON-COMPOSITE; ORGANIC SOLDERABILITY PRESERVATIVE; SN3.8AG0.7CU; SOLDER JOINTS; SQUARE ROOTS;

EID: 70350126964     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.06.171     Document Type: Article
Times cited : (81)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.