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Volumn 470, Issue 1-2, 2009, Pages 188-194

Effects of multiple reflows on interfacial reaction and shear strength of SnAgCu and SnPb solder joints with different PCB surface finishes

Author keywords

Intermetallics (IM); Kinetics; Liquid solid reactions; Microstructure; Scanning electron microscopy (SEM)

Indexed keywords

BRAZING; COPPER; DIFFUSION; DUCTILE FRACTURE; ELECTRON MICROSCOPY; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; GROWTH (MATERIALS); GROWTH KINETICS; INTERMETALLICS; MICROSTRUCTURE; NICKEL; ORE TREATMENT; POLYCHLORINATED BIPHENYLS; SCANNING; SCANNING ELECTRON MICROSCOPY; SHEAR STRENGTH; SOLDERING ALLOYS; STRENGTH OF MATERIALS; SUBSTRATES; TIN; WELDING;

EID: 59249099111     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2008.02.102     Document Type: Article
Times cited : (82)

References (14)
  • 1
    • 59249094025 scopus 로고    scopus 로고
    • iNEMI, Lead-free Assembly Project, available at: http://www.inemi.org/cms/projects/ese/lf assembly.html
    • iNEMI, Lead-free Assembly Project, available at: http://www.inemi.org/cms/projects/ese/lf assembly.html
  • 8
    • 59249091062 scopus 로고    scopus 로고
    • K. Zeng, V. Vuorinen, J.K. Kivilahti, Electron. Compo. Tech. Conf., IEEE, 2001.
    • K. Zeng, V. Vuorinen, J.K. Kivilahti, Electron. Compo. Tech. Conf., IEEE, 2001.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.