Tutorial on x-ray microLaue diffraction

Materials Characterization

Volumn 60, Issue 11, 2009, Pages 1191-1201

  Ice, Gene E ^a   Pang, Judy W L ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Deformation; Diffraction; Fracture; Grain growth; Laue; Microbeam; X ray

Indexed keywords

COMPLEX MATERIALS; DEFORMATION AND FRACTURE; LAUE; LAUE DIFFRACTION; MESOSCALE STRUCTURE; MICROBEAM; SAMPLE SURFACE; SELF-ORGANIZATIONS; STRAIN RESOLUTION; SUBMICRON; X-RAY DIFFRACTION METHOD; X-RAY SOURCES;

CRYSTAL STRUCTURE; DEFORMATION; DIFFRACTION; FRACTURE; GRAIN SIZE AND SHAPE; LIGHT; X RAYS;

GRAIN GROWTH;

EID: 70349448410     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2009.07.006     Document Type: Short Survey

References (56)

1. von Laue M. Concerning the detection of X-ray interferences. Nobel lecture (1914)
2. Eades J.A. Microdiffractions contribution to micro-characterization. Ultramicroscopy 24 2-3 (1988) 143-154
3. Electron Backscattering Diffraction in Materials Science. New York: Kluwer Academic/Plenum Publishers; 2000.
4. Bastos A., Zaefferer S., and Raabe D. Three-dimensional EBSD study on the relationship between triple junctions and columnar grains in electrodeposited Co-Ni films. J Microsc Oxford 230 3 (2008) 487-498
5. Liu T., Raabe D., and Zaefferer S. A 3D tomographic EBSD analysis of a CVD diamond thin film. Sci Technol Adv Mater 9 3 (2008)
6. Tsunekaw Y., and Weissman S. Importance of microplasticity in fracture of silicon. Metall Trans 5 7 (1974) 1585-1593
7. Liu H.Y., and Mayo W.E. Mapping and analysis of microplasticity in tensile-deformed double-notched silicon-crystals by computer-aided x-ray rocking curve analyzer. J Met 36 7 (1984) 17
8. Liu H.Y., Weng G.J., and Weissmann S. Determination of notch-tip plasticity by x-ray diffraction and comparison to continuum-mechanics analysis. J Appl Crystallogr 15 (DEC 1982) 594-601
9. Yamamoto N., and Hosokawa Y. Development of an innovative 5 mu-m-phi focused x-ray-beam energy-dispersive spectrometer and its applications. Jpn J Appl Phys 27 11 (1988) L2203-L2206
10. Yamamoto N., and Sakata S. Applications of a micro x-ray spectrometer and a computer simulator for stress-analyses in Al interconnections. Jpn J Appl Phys 28 11 (1989) L2065-L2068
11. Yamamoto N., and Sakata S. Strain analysis in fine Al interconnections by x-ray-diffraction spectrometry using micro x-ray-beam. Jpn J Appl Phys 34 6A (1995) L664-L667
12. Rebonato R., Ice G.E., Habenschuss A., and Bilello J.C. High-resolution microdiffraction study of notch-tip deformation in mo single-crystals using x-ray synchrotron radiation. Philos Mag A Phys Condens Matter Struct Defects Mech Prop 60 5 (1989) 571-583
13. Larson B.C., Yang W., Ice G.E., Budai J.D., and Tischler J.Z. Three-dimensional X-ray structural microscopy with submicrometre resolution. Nature 415 6874 (2002) 887-890
14. Bhat H.L., Klapper H., and Roberts K.J. Slit-collimated Laue diffraction using synchrotron radiation: an examination of the paraelectric-to-ferroelectric phase transformation in ammonium sulfate. J Appl Crystallogr 28 (1995) 827-829
15. Hirano T., Higashi F., and Usami K. X-ray microdiffractometer using synchrotron radiation. Rev Sci Instrum 63 12 (1992) 5602-5606
16. Takanishi Y., Iida A., Ishikawa K., Takezoe H., and Fukuda A. Spontaneous layer twist in a stripe texture of chiral ferroelectric smectics observed by synchrotron X-ray microdiffraction. Jpn J Appl Phys 35 2A (1996) 683-687
17. Mooney P.M., Jordan-Sweet J.L., Noyan I.C., Kaldor S.K., and Wang P.C. Observation of local tilted regions in strain-relaxed SiGe/Si buffer layers using x-ray microdiffraction. Appl Phys Lett 74 5 (1999) 726-728
18. Noyan I.C., Jordan-Sweet J., Liniger E.G., and Kaldor S.K. Characterization of substrate/thin-film interfaces with x-ray microdiffraction. Appl Phys Lett 72 25 (1998) 3338-3340
19. Riekel C., Bosecke P., and Delrio M.S. 2 high brillance beam lines at the ESRF dedicated to microdiffraction, biological crystallography, and small-angle scattering (invited). Rev Sci Instrum 63 1 (1992) 974-981
20. Wenk H.R., Heidelbach F., Chateigner D., and Zontone F. Laue orientation imaging. J Synchrotron Radiat 4 (1997) 95-101
21. Valek B.C., Bravman J.C., Tamura N., MacDowell A.A., Celestre R.S., Padmore H.A., et al. Electromigration-induced plastic deformation in passivated metal lines. Appl Phys Lett 81 22 (2002) 4168-4170
22. Budai J.D., Yang W.G., Tamura N., Chung J.S., Tischler J.Z., Larson B.C., et al. X-ray microdiffraction study of growth modes and crystallographic tilts in oxide films on metal substrates. Nat Mater 2 7 (2003) 487-492
23. Park J.H., Park J., Lee K.B., Koo T.Y., Youn H.S., Ko Y.D., et al. Local strain-induced 90 degrees domain switching in a barium titanate single crystal. Appl Phys Lett 91 1 (2007)
24. Maass R., Van Petegem S., Van Swygenhoven H., Derlet P.M., Volkert C.A., and Grolimund D. Time-resolved laue diffraction of deforming micropillars. Phys Rev Lett 99 14 (2007)
25. Feng R., Gerson A., Ice G., Reininger R., Yates B., and McIntyre S. VESPERS: a beamline for combined XRF and XRD measurements. In: Choi J.-Y., and Rah S. (Eds). 9th International Conference on Synchrotron Radiation Instrumentation; 2006 (2006), American Institute of Physics, Pohang, Gyeongbuk, South Korea 872-874
26. Gerson AR. 3D-microdiffraction: a facility for the Australian synchrotron. Current Applied Physics 2008;8:463-6.
27. Goudeau P., and Thomas O. Synchrotron Laue micro-diffraction: a new beam line project at SOLEIL for phase identification and mechanics of materials (2007)
28. Kunz M., Tamura N., Chen K., MacDowell A.A., Celestre R.S., Church M.M., et al. A dedicated superbend x-ray microdiffraction beamline for materials, geo-, and environmental sciences at the advanced light source. Rev Sci Instrum 80 3 (2009)
29. Warren B.E. X-ray diffraction (1990), Dover Publications
30. Chung J.S., and Ice G.E. Automated indexing for texture and strain measurement with broad-bandpass x-ray microbeams. J Appl Phys 86 9 (1999) 5249-5255
31. Larson B.C., El-Azab A., Yang W.G., Tischler J.Z., Liu W.J., and Ice G.E. Experimental characterization of the mesoscale dislocation density tensor. Philos Mag 87 8-9 (2007) 1327-1347
32. Noyan I.C., and Cohen J.B. Residual stress, measurement by diffraction and interpretation (1987), Spring Verlag, New York
33. Busing W.R., and Levy H.A. Angle calculations for 3- and 4- circle x-ray and neutron diffractometers. Acta Crystallogr 22 (1967) 457-464
34. Ice G.E., and Barabash R. White beam microdiffraction and dislocations gradients. Dislocations in Solids (2007), Elsevier 500-601
35. Ice G.E., Barabash R., and Pang J. Polychromatic x-ray microdiffraction characterization of local crystallograhic structure and defect distribution. Encyclopedia of materials: science and technology updates (2005), Elsevier, Oxford
36. Barabash R.I., Ice G.E., and Walker F.J. Quantitative microdiffraction from deformed crystals with unpaired dislocations and dislocation walls. J Appl Phys 93 3 (2003) 1457-1464
37. Fleck N.A., Muller G.M., Ashby M.F., and Hutchinson J.W. Strain gradient plasticity - theory and experiment. Acta Metall Mater 42 2 (1994) 475-487
38. Gao H., Huang Y., Nix W.D., and Hutchinson J.W. Mechanism-based strain gradient plasticity - I. Theory. J Mech Phys Solids 47 6 (1999) 1239-1263
39. Yang W., Larson B.C., Pharr G.M., Ice G.E., Budai J.D., Tischler J.Z., et al. Deformation microstructure under microindents in single-crystal Cu using three-dimensional x-ray structural microscopy. J Mater Res 19 1 (2004) 66-72
40. Budai J.D., Yang M., Larson B.C., Tischler J.Z., Liu W., Weiland H., et al. Three-dimensional micron-resolution X-ray Laue diffraction measurement of thermal grain-evolution in aluminum. Bacroix BDJHLRMCPRRHTL (2004) 1373-1378 Recrystallization and grain growth, pts 1 and 2
41. Sobiech M., Wohlschlogel M., Welzel U., Mittemeijer E.J., Hugel W., Seekamp A., et al. Local submicron, strain gradients as the cause of Sn whisker growth. Appl Phys Lett 94 (2009) 221901
42. Pang J.W.L., Barabash R., Liu W., and Ice G.E. Determination of deformation inhomogeneity in polycrystalline Ni under uniaxial tension with 3d x-ray microscope. TMS Lett 1 (2004) 5-6
43. Ice GE, Barabash RI, Pang J. 'Multiscale phenomena in materials experiments and modeling related to mechanical behavior'. In: Hussein M. Zbib, DHL, Lyle E. Levine, Kevin J. Hemker, editor. 2003 MRS Spring Meeting; 2003; San Francisco, CA; 2003. pp. 231-236.
44. Ohashi T., Barabash R., Pang J.W.L., Ice G.E., and Barabash O.M. X-ray microdiffraction and strain gradient crystal plasticity studies of geometrically necessary dislocations near a Ni bicrystal grain boundary. Int J Plast 25 5 (2009) 920-941
45. Ice G.E., and Barabash R. Chapter 79 white beam microdiffraction and dislocations gradients. In: Nabarro F.R.N., and Hirth J.P. (Eds). Dislocations in solids (2007), Elsevier
46. Ohashi T. Finite-element analysis of plastic slip and evolution of geometrically necessary dislocations in fcc crystals. Philos Mag Lett 75 2 (1997) 51-57
47. Ohashi T. Crystal plasticity analysis of dislocation emission from micro voids. Int J Plast 21 11 (2005) 2071-2088
48. Hahner P., Bay K., and Zaiser M. Fractal dislocation patterning during plastic deformation. Phys Rev Lett 81 12 (1998) 2470-2473
49. Miguel M.C., Vespignani A., Zaiser M., and Zapperi S. Dislocation jamming and Andrade creep. Phys Rev Lett 89 16 (2002)
50. Zaiser M., Bay K., and Hahner P. Fractal analysis of deformation-induced dislocation patterns. Acta Mater 47 8 (1999) 2463-2476
51. Zaiser M., Grasset F.M., Koutsos V., and Aifantis E.C. Self-affine surface morphology of plastically deformed metals. Phys Rev Lett 93 19 (2004)
52. Farrell K., Specht E.D., Pang J., Walker L.R., Rar A., and Mayotte J.R. Characterization of a carburized surface layer on an austenitic stainless steel. J Nucl Mater 343 1-3 (2005) 123-133
53. Sun Y., Li X., and Bell T. Structural characteristics of low temperature plasma carburised austenitic stainless steel. Mater Sci Technol 15 10 (1999) 1171-1178
54. Mimura H., Yumoto H., Matsuyama S., Sano Y., Yamamura K., Mori Y., et al. Efficient focusing of hard x rays to 25 nm by a total reflection mirror. Appl Phys Lett 90 5 (2007)
55. Ice G. The future of spatially-resolved polychromatic neutron and x-ray microdiffraction. Metall Mater Trans A Phys Metall Mater Sci 39A 13 (2008) 3058-3064
56. Ice G.E., Pang J.W.L., Larson B.C., Budai J.D., Tischler J.Z., Choi J.-Y., et al. At the limit fo polychromatic microdiffraction (2009)