Quantitative characterisation of surfaces and defects on PtRu nanoparticles using combined exit wave restoration and aberration-corrected TEM

Microscopy and Microanalysis

Volumn 14, Issue SUPPL. 2, 2008, Pages 426-427

  Chang, L Y ^a,b   Maunders, C ^a   Baranova, E A ^c   Bock, C ^c   Botton, G A ^a  

^a MCMASTER UNIVERSITY   (Canada)

^b UNIVERSITY OF OXFORD   (United Kingdom)

^c NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 49549091324     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927608086728     Document Type: Conference Paper

References (7)

1. E. A. Baranova, C. Bock, D. Ilin, D. Wang, B. MacDougall, Surf. Sci. 600 (2006) 3502
2. L. Marks et al., Nature 303 (1983) 316.
3. M. Haider et al., Optik 99 (1995) 167.
4. R. R. Meyer et al., Ultramicroscopy 92 (2002) 89.
5. L. Gontard-Cervera et al., Angewandte Chemie Int. Ed. 46 (2007) 3683.
6. G. Lovely et al., Appl. Phys. Lett. 88 (2006) 093124.
7. J. M. Cowley and A. F. M. Moodie, Acta. Crystallogr. 10 (1957) 609.