Conductive nichrome probe tips: Fabrication, characterization and application as nanotools

Nanotechnology

Volumn 20, Issue 39, 2009, Pages

  Peng, Yong ^a   Cullis, Tony ^a   Möbus, Günter ^a   Xu, Xiaojing ^a   Inkson, Beverley ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL CHARACTERIZATION; ELECTRICAL TESTING; FUNCTIONALIZED; HIGH HARDNESS; HIGH RESISTANCE; HIGH RESISTIVITY; LOW RESISTANCE; NANO SCALE; NANO-TOOL; NANOTOOLS; NANOWELDING; NICHROME; PROBE TIPS; SCANNING PROBES; SIZE AND SHAPE;

NANOSTRUCTURED MATERIALS; OHMIC CONTACTS;

PROBES;

NANOMATERIAL;

ARTICLE; CHEMICAL ANALYSIS; HARDNESS; NANOANALYSIS; NANOCHEMISTRY; NANOFABRICATION; PRIORITY JOURNAL; REGIONAL ANESTHESIA; STRUCTURE ANALYSIS;

EID: 70349111854     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/39/395708     Document Type: Article

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