Fabrication of submicron-scale manganese-nickel tips for spin-polarized STM studies

Applied Surface Science

Volumn 144-145, Issue , 1999, Pages 497-500

  Murphy, S ^a   Osing, J ^a   Shvets, I V ^a  

^a TRINITY COLLEGE DUBLIN   (Ireland)

Author keywords

Antiferromagnet; MnNi; p(3 1); STM; W(100)

Indexed keywords

ANTIFERROMAGNETIC MATERIALS; ATOMS; FABRICATION; IMAGING TECHNIQUES; MAGNETIC MOMENTS; MANGANESE ALLOYS; PROBES; TEMPERATURE; TUNGSTEN ALLOYS;

ATOMIC RESOLUTION IMAGING; NEEL TEMPERATURE; SPIN POLARIZED SCANNING TUNNELING MICROSCOPY; SUBMICRON SCALE MANGANESE NICKEL TIPS;

SCANNING TUNNELING MICROSCOPY;

EID: 0032662235     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00852-6     Document Type: Article

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