Preparation and characterization of electrochemically etched W tips for STM

Measurement Science and Technology

Volumn 10, Issue 1, 1999, Pages 11-18

  Ekvall, Inger ^a   Wahlström, Erik ^a   Claesson, Dan ^a   Olin, Håkan ^a   Olsson, Eva ^b  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^b UPPSALA UNIVERSITY   (Sweden)

Author keywords

Scanning tunnelling microscopy; STM; STM tip composition; STM tip shape; TEM; UHV

Indexed keywords

CHEMICAL OPERATIONS; CLEANING; ELECTROCHEMISTRY; ETCHING; HEATING; ION BOMBARDMENT; IONS; SPUTTERING; TRANSMISSION ELECTRON MICROSCOPY; TUNGSTEN;

ARGON ION SPUTTERING; DECAPITATION; TUNGSTEN TIPS;

SCANNING TUNNELING MICROSCOPY;

EID: 0032654429     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/10/1/006     Document Type: Article

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