Accurate electrical testing of individual gold nanowires by in situ scanning electron microscope nanomanipulators

Applied Physics Letters

Volumn 93, Issue 18, 2008, Pages

  Peng, Yong ^a   Cullis, Tony ^a   Inkson, Beverley ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC PROPERTIES; GOLD; MANIPULATORS; MICROMANIPULATORS; MICROSCOPES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOWIRES; SCANNING; SCANNING ELECTRON MICROSCOPY;

ACCURATE MEASUREMENTS; BUILDING BLOCKS; ELECTRICAL EFFECTS; ELECTRICAL PROPERTIES; FAILURE CURRENTS; GOLD NANOWIRES; IN SITU SCANNING; IN-SITU; INTER-CONNECTS; INTRINSIC CONDUCTIVITIES; NANO DEVICES; NANO MANIPULATORS; NANOWIRE LENGTHS; POLYCRYSTAL LINES; POLYCRYSTALLINE GRAINS; SCANNING ELECTRON MICROSCOPES;

ELECTRIC WIRE;

EID: 55849088741     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3005423     Document Type: Article

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