Effect of microstructural evolution on magnetic properties of Ni thin films

Bulletin of Materials Science

Volumn 32, Issue 3, 2009, Pages 263-270

  Kumar, Prashant ^a   Krishna, M Gnanashyam ^a   Bhattacharya, A K ^b  

^a UNIVERSITY OF HYDERABAD   (India)

^b UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Atomic force microscopy; Magnetic thin films; Phase contrast imaging; Substrate temperature; Thermal evaporation

Indexed keywords

AMBIENT TEMPERATURES; BOROSILICATE GLASS SUBSTRATES; COERCIVE FIELD; COMPRESSIVE STRAIN; CRITICAL VALUE; CRYSTALLINE ORDER; DEPOSITION TEMPERATURES; ENERGY DENSITY; GRAIN SIZE; LONG RANGE ORDERS; NANOCRYSTALLINES; NI THIN FILMS; NICKEL THIN FILM; PHASE CONTRAST IMAGING; PHASE-CONTRAST IMAGE; PHASE-CONTRAST MICROSCOPY; SHAPE ANISOTROPY; SUBSTRATE TEMPERATURE;

ASPECT RATIO; ATOMIC FORCE MICROSCOPY; BOROSILICATE GLASS; COERCIVE FORCE; CRYSTALLITE SIZE; DEPOSITION; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; IMAGING TECHNIQUES; LITHIUM COMPOUNDS; MAGNETIC FILMS; MAGNETIC THIN FILMS; MAGNETISM; MAGNETS; NANOCRYSTALLINE MATERIALS; NICKEL; PHASE INTERFACES; SATURATION MAGNETIZATION; TEMPERATURE; THERMAL EVAPORATION; THIN FILMS; VAPORS;

SUBSTRATES;

EID: 70249116452     PISSN: 02504707     EISSN: None     Source Type: Journal    
DOI: 10.1007/s12034-009-0040-x     Document Type: Article

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