Magnetic properties of sputtered soft magnetic Fe-Ni films with an uniaxial anisotropy

Thin Solid Films

Volumn 440, Issue 1-2, 2003, Pages 54-59

  Kim, Jung Gi ^a   Han, Kyung Hunn ^a   Song, Seok Ho ^a   Reilly, Anne ^b  

^a Hanyang University   (South Korea)

^b Dept of Economics and Thomas Jefferson Program in Public Policy at the College of William and Mary   (United States)

Author keywords

Fe Ni film; Magnetic hysteresis; Spin wave; Uniaxial anisotropy; X ray diffraction

Indexed keywords

CRYSTAL MICROSTRUCTURE; MAGNETIC ANISOTROPY; MAGNETIC HYSTERESIS; MAGNETIZATION; POLYCRYSTALLINE MATERIALS; SOFT MAGNETIC MATERIALS; THICKNESS MEASUREMENT; X RAY DIFFRACTION ANALYSIS;

UNIAXIAL ANISOTROPY;

THIN FILMS;

EID: 0042623353     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00829-0     Document Type: Article

References (29)

1. Guillaume C.E. C. R. Acad. Sci. 125:1897;235.
2. Crangle J., Hallam G.C. Proc. R. Soc. Lond. A. 272:1963;119.
3. Hoffmann E., Herper H., Entel P., Mishra S.G., Mohn P., Schwarz K. Phys. Rev. B. 47:1993;5589.
4. Dumpich G., Kästner J., Kirschbaum U., Mühlbauer H., Liang J., Lübeck Th., Wassermann E.F. Phys. Rev. B. 46:1992;1058.
5. Smith D.O., Weiss G.P., Harte K.J. J. Appl. Phys. 37:1966;1464.
6. Valenta L. Phys. Status Solidi. 2:1962;112.
7. Klein M.J., Smith R.S. Phys. Rev. 81:1951;378.
8. Hubbard J. Phys. Rev. B. 23:1981;5974.
9. Powder Diffraction file, Joint Committee on Powder Diffraction Standards, ASTM, Philadelphia, PA, 1980, Card 471405.
10. O'Handley R.C. Modern Magnetic Materials: Principles and Application. 1999;180 John Wiley & Sons, Inc, New York, NY.
11. Pearson W.B. Handbook of Lattice Spacing and Structures of Metals and Alloys. 1958;640 Pergamon Press, London.
12. Stoner E.C., Wolhfarth E.P. Phil. Trans. A. 240:1948;599.
13. Takahashi M., Watanabe D., Kono T., Ogawa S. J. Phys. Soc. Jpn. 15:1960;1351.
14. Néel L. J. Phys. Rad. 17:1956;250.
15. Min H.G., Kim S.H., Li M., Wedding J.B., Wang G.C. Surf. Sci. 400:1998;19.
16. Middelhoek S. J. Appl. Phys. 34:1961;1054.
17. Glass S.J., Kein M.J. Phys. Rev. 109:1958;288.
18. Crangle J., Hallam G.C. Proc. Phys. Soc. A. 272:1963;119.
19. Krey U. Z. Phys. B. 31:1978;247.
20. Meyer A.J., Asch G. J. Appl. Phys. 32:1961;330S.
21. Nakai I., Ono F., Yamada O. J. Phys. Soc. Jpn. 52:1983;1791.
22. Kubo R. Phys. Rev. 87:1952;568.
23. Oguchi T. Phys. Rev. 117:1960;123.
24. Kim J.G., Han K.H., Jenog J.Y., Lee J.S., Qin X.Y., Shin K.H. J. Kor. Phys. Soc. 38:2001;387.
25. Cochrance R.W., Graham G.M. Can. J. Phys. 48:1970;264.
26. Sondheimer E.H. Adv. Phys. 1:1952;1.
27. Mayadas A.F., Shatzkes H. Phys. Pev. B. 1:1970;1381.
28. Angadi M.A., Udachan L.A. Thin Solid Films. 78:1981;299.
29. Cahn R.W., Haasen P., Kramer E.J. Materials Science and Technology: Volume 3B, Electronic and Magnetic Properties of Metals and Ceramics Part II. 1994;439 VCH Publishers Inc, New York.