SCOPUS 정보 검색 플랫폼

Journal of Materials Science

Volumn 44, Issue 19, 2009, Pages 5288-5296

Nanoscale defects and microwave properties of (BaSr)TiO3 ferroelectric thin films

(2) Jackson, T J a Jones, I P a

a UNIVERSITY OF BIRMINGHAM (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BULK MATERIALS; MICROWAVE PROPERTY; NANOSCALE DEFECTS; THIN FILM FERROELECTRICS; TIO;

DEFECTS; FERROELECTRIC FILMS; FERROELECTRIC MATERIALS; FERROELECTRIC THIN FILMS; MICROWAVE DEVICES; POINT DEFECTS;

MICROWAVES;

EID: 68949187956 PISSN: 00222461 EISSN: 15734803 Source Type: Journal
DOI: 10.1007/s10853-009-3666-6 Document Type: Article

Times cited : (31)

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