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Volumn 77, Issue , 2006, Pages 87-92

High frequency loss modeling using dielectric relaxation

Author keywords

Dielectric spectroscopy; High frequency measurements; Impedance spectroscopy

Indexed keywords

DIELECTRIC SPECTROSCOPY; ELECTRODE-FILM INTERFACES; HIGH FREQUENCY MEASUREMENTS; IMPEDANCE SPECTROSCOPY;

EID: 33645515935     PISSN: 10584587     EISSN: 16078489     Source Type: Conference Proceeding    
DOI: 10.1080/10584580500414184     Document Type: Conference Paper
Times cited : (3)

References (1)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.