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Volumn 77, Issue , 2006, Pages 87-92
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High frequency loss modeling using dielectric relaxation
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Author keywords
Dielectric spectroscopy; High frequency measurements; Impedance spectroscopy
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Indexed keywords
DIELECTRIC SPECTROSCOPY;
ELECTRODE-FILM INTERFACES;
HIGH FREQUENCY MEASUREMENTS;
IMPEDANCE SPECTROSCOPY;
CAPACITANCE;
COMPUTER SIMULATION;
DIELECTRIC RELAXATION;
ELECTRIC VARIABLES MEASUREMENT;
ELECTRODES;
FREQUENCIES;
DIELECTRIC LOSSES;
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EID: 33645515935
PISSN: 10584587
EISSN: 16078489
Source Type: Conference Proceeding
DOI: 10.1080/10584580500414184 Document Type: Conference Paper |
Times cited : (3)
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References (1)
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