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Volumn 24, Issue 4, 2009, Pages

First- and second-order electrical modelling and experiment on very high speed SiGeC heterojunction bipolar transistors

Author keywords

[No Author keywords available]

Indexed keywords

GERMANIUM COMPOUNDS; HETEROJUNCTIONS; OSCILLATORS (ELECTRONIC); PARAMETER EXTRACTION; SILICON COMPOUNDS;

EID: 68849107520     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/24/4/045010     Document Type: Article
Times cited : (5)

References (20)
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    • 230 GHz self-aligned SiGeC HBT for optical and millimeter-wave applications
    • Chevalier P et al 2005 230 GHz self-aligned SiGeC HBT for optical and millimeter-wave applications IEEE J. Solid-State Circuit 40 2025-34
    • (2005) IEEE J. Solid-State Circuit , vol.40 , pp. 2025-2034
    • Chevalier, P.1
  • 2
    • 39049150214 scopus 로고    scopus 로고
    • 250-GHz self-aligned Si/SiGeC HBT featuring an all-implanted collector
    • 8-10 October 2006
    • Chevalier P et al 250-GHz self-aligned Si/SiGeC HBT featuring an all-implanted collector Bipolar/BiCMOS Circuits and Technology Meeting (8-10 October 2006) pp 1-4
    • Bipolar/BiCMOS Circuits and Technology Meeting , pp. 1-4
    • Chevalier, P.1
  • 3
    • 13244255691 scopus 로고    scopus 로고
    • Incorporation of boron in SiGe(C) epitaxial layers grown by reduced pressure chemical vapor deposition
    • Hallstedt J, Parent A, stling M and Radamson H H 2005 Incorporation of boron in SiGe(C) epitaxial layers grown by reduced pressure chemical vapor deposition Mater. Sci. 8 97-101
    • (2005) Mater. Sci. , vol.8 , pp. 97-101
    • Hallstedt, J.1    Parent, A.2    Stling, M.3    Radamson, H.H.4
  • 5
    • 0033247182 scopus 로고    scopus 로고
    • Modélisation dela conduction dans la diode émetteur-base d'un transistor bipolaire compatible CMOS
    • Latreche S and Gontrand C 1999 Modélisation dela conduction dans la diode émetteur-base d'un transistor bipolaire compatible CMOS Phys. Status Solidi b 214 203-15
    • (1999) Phys. Status Solidi B , vol.214 , pp. 203-215
    • Latreche, S.1    Gontrand, C.2
  • 7
    • 0036638898 scopus 로고    scopus 로고
    • Hierarchical 2-D DD and HD noise simulations of Si and SiGe devices - Part II: Results
    • DOI 10.1109/TED.2002.1013284, PII S0018938302059555
    • Jungemann C, Neinhus B, Decker S and Meinerzhagen B 2002 Hierarchical 2-D DD and HD noise simulations of Si and SiGe devices: II. Results IEEE Trans. Electron Devices 49 1258-64 (Pubitemid 34916000)
    • (2002) IEEE Transactions on Electron Devices , vol.49 , Issue.7 , pp. 1258-1264
    • Jungemann, C.1    Neinhus, B.2    Decker, S.3    Meinerzhagen, B.4
  • 8
    • 0036637849 scopus 로고    scopus 로고
    • Hierarchical 2-D DD and HD noise simulations of Si and SiGe devices - Part I: Theory
    • DOI 10.1109/TED.2002.1013283, PII S0018938302059543
    • Jungemann C, Neinhus B and Meinerzhagen B 2002 Hierarchical 2-D DD and HD noise simulations of Si and SiGe devices: I. Theory IEEE Trans. Electron Devices 49 1250-7 (Pubitemid 34915999)
    • (2002) IEEE Transactions on Electron Devices , vol.49 , Issue.7 , pp. 1250-1257
    • Jungemann, C.1    Neinhus, B.2    Meinerzhagen, B.3
  • 10
    • 33745763561 scopus 로고    scopus 로고
    • A new negative-differential-resistance effect in 350 GHz SiGe HBTs operating at cryogenic temperatures
    • Liang Q et al 2006 A new negative-differential-resistance effect in 350 GHz SiGe HBTs operating at cryogenic temperatures Solid-State Electron. 50 964-72
    • (2006) Solid-State Electron. , vol.50 , pp. 964-972
    • Liang, Q.1
  • 15
    • 1142267920 scopus 로고    scopus 로고
    • y alloys on Si(00l)
    • y alloys on Si(00l) J. Appl. Phys. 84 2716-21
    • (1998) J. Appl. Phys. , vol.84 , pp. 2716-2721
    • Osten, H.J.1
  • 16
    • 68849115946 scopus 로고    scopus 로고
    • ISE: Integrated Systems Engineering AG DESSIS (Synopsis)
    • ISE: Integrated Systems Engineering AG (www.ise.com), DESSIS (Synopsis)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.