Quantitative EFTEM measurement of the composition of embedded particles

Journal of Materials Science

Volumn 41, Issue 14, 2006, Pages 4394-4404

  Lozano Perez, S ^a   Titchmarsh, J M ^a   Jenkins, M L ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; COMPUTER SIMULATION; COPPER; EXTRAPOLATION; NANOSTRUCTURED MATERIALS; PARTICLE SIZE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

BACKGROUND EXTRAPOLATION; COMPOSITION MEASUREMENTS; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY.; EXPERIMENTAL DATA;

EMBEDDED SYSTEMS;

EID: 33747136228     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-006-0093-9     Document Type: Conference Paper

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