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Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 27, Issue 4, 2009, Pages 2015-2019

Diffraction studies of submonolayer Sr structures on the Si (001) surface

(7) Reiner, J W a Segal, Y a Garrity, K F a Hong, H b Ismail Beigi, S a Ahn, C H a Walker, F J a

a Yale University (United States)

b ARGONNE NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE OXIDES; DIFFRACTION STUDIES; HETEROSTRUCTURES; HIGH-ENERGY ELECTRON; IN-SITU; ROOM TEMPERATURE; SI SURFACES; SI(0 0 1); SI(001) SURFACES; SR DEPOSITION; SUBMONOLAYER; SURFACE PHASE; SURFACE PHASIS; SURFACE SYMMETRY; SYNCHROTRON X RAY DIFFRACTION; X-RAY ENERGIES;

ATOMS; CRYSTALLINE MATERIALS; DIFFRACTION; HIGH ENERGY ELECTRON DIFFRACTION; MONOLAYERS; OLIGOMERS; SILICON; STOICHIOMETRY; SYNCHROTRON RADIATION; SYNCHROTRONS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

CRYSTAL ATOMIC STRUCTURE;

EID: 68349159136 PISSN: 10711023 EISSN: None Source Type: Journal
DOI: 10.1116/1.3139866 Document Type: Article

Times cited : (7)

References (18)

1
- 4244101024
- 0031-9007,. 10.1103/PhysRevLett.81.3014
- R. A. McKee, F. J. Walker, and M. F. Chisholm, Phys. Rev. Lett. 0031-9007 81, 3014 (1998). 10.1103/PhysRevLett.81.3014
- (1998) Phys. Rev. Lett. , vol.81 , pp. 3014
- McKee, R.A.¹ Walker, F.J.² Chisholm, M.F.³

2
- 0036649104
- Critical issues in the heteroepitaxial growth of alkaline-earth oxides on silicon
- DOI 10.1116/1.1482710
- J. Lettieri, J. H. Haeni, and D. G. Schlom, J. Vac. Sci. Technol. A 0734-2101 20, 1332 (2002). 10.1116/1.1482710 (Pubitemid 34891104)
- (2002) Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films , vol.20 , Issue.4 , pp. 1332-1340
- Lettieri, J.¹ Haeni, J.H.² Schlom, D.G.³

3
- 0346458533
- The interface between silicon and a high-k oxide
- DOI 10.1038/nature02204
- C. J. Först, C. R. Ashman, K. Schwarz, and P. E. Blöchl, Nature (London) 0028-0836 427, 53 (2004). 10.1038/nature02204 (Pubitemid 38094817)
- (2004) Nature , vol.427 , Issue.6969 , pp. 53-56
- Forst, C.J.¹ Ashman, C.R.² Schwarz, K.³ Blochl, P.E.⁴

4
- 0038179370
- The interface phase and the Schottky barrier for a crystalline dielectric on silicon
- DOI 10.1126/science.1083894
- R. A. McKee, F. J. Walker, M. B. Nardelli, W. A. Shelton, and G. M. Stocks, Science 0036-8075 300, 1726 (2003). 10.1126/science.1083894 (Pubitemid 36712564)
- (2003) Science , vol.300 , Issue.5626 , pp. 1726-1730
- McKee, R.A.¹ Walker, F.J.² Nardelli, M.B.³ Shelton, W.A.⁴ Stocks, G.M.⁵

5
- 1642303748
- 0163-1829,. 10.1103/PhysRevB.69.075309
- C. R. Ashman, C. J. Först, K. Schwarz, and P. E. Blöchl, Phys. Rev. B 0163-1829 69, 075309 (2004). 10.1103/PhysRevB.69.075309
- (2004) Phys. Rev. B , vol.69 , pp. 075309
- Ashman, C.R.¹ Först, C.J.² Schwarz, K.³ Blöchl, P.E.⁴

6
- 0030562649
- STM study of Sr adsorption on Si(100) surface
- DOI 10.1016/0169-4332(95)00413-0
- R. Z. Bakhtizin, J. Kishimoto, T. Hashizume, and T. Sakurai, Appl. Surf. Sci. 0169-4332 94-95, 478 (1996). 10.1016/0169-4332(95)00413-0 (Pubitemid 126348280)
- (1996) Applied Surface Science , vol.94-95 , pp. 478-484
- Bakhtizin, R.Z.¹ Kishimoto, J.² Hashizume, T.³ Sakurai, T.⁴

7
- 0242662327
- 0039-6028,. 10.1016/j.susc.2003.09.031
- D. M. Goodner, D. L. Marasco, A. A. Escuadro, L. Cao, B. P. Tinkham, and M. J. Bedzyk, Surf. Sci. 0039-6028 547, 19 (2003). 10.1016/j.susc.2003.09.031
- (2003) Surf. Sci. , vol.547 , pp. 19
- Goodner, D.M.¹ Marasco, D.L.² Escuadro, A.A.³ Cao, L.⁴ Tinkham, B.P.⁵ Bedzyk, M.J.⁶

8
- 0035894205
- Photoemission from the Sr/Si(001) interface
- DOI 10.1063/1.1415758
- A. Herrera-Gómez, F. S. Aguirre-Tostado, Y. Sun, P. Pianetta, Z. Yu, D. Marshall, R. Droopad, and W. E. Spicer, J. Appl. Phys. 0021-8979 90, 6070 (2001). 10.1063/1.1415758 (Pubitemid 34046760)
- (2001) Journal of Applied Physics , vol.90 , Issue.12 , pp. 6070
- Herrera-Gomez, A.¹ Aguirre-Tostado, F.S.² Sun, Y.³ Pianetta, P.⁴ Yu, Z.⁵ Marshall, D.⁶ Droopad, R.⁷ Spicer, W.E.⁸

9
- 55349145229
- 0021-9606,. 10.1063/1.3001580
- W. Du, B. Wang, L. Xu, Z. Hu, X. Cui, B. C. Pan, J. Yang, and J. G. Hou, J. Chem. Phys. 0021-9606 129, 164707 (2008). 10.1063/1.3001580
- (2008) J. Chem. Phys. , vol.129 , pp. 164707
- Du, W.¹ Wang, B.² Xu, L.³ Hu, Z.⁴ Cui, X.⁵ Pan, B.C.⁶ Yang, J.⁷ Hou, J.G.⁸

10
- 0001140760
- STM observation of the 2×3 and c(2×6) structures on Ba/Si(1 0 0)
- DOI 10.1016/S0039-6028(01)01392-9, PII S0039602801013929
- K. Ojima, M. Yoshimura, and K. Ueda, Surf. Sci. 0039-6028 491, 169 (2001). 10.1016/S0039-6028(01)01392-9 (Pubitemid 43239281)
- (2001) Surface Science , vol.491 , Issue.1-2 , pp. 169-174
- Ojima, K.¹ Yoshimura, M.² Ueda, K.³

11
- 0033893350
- (3 × 2) phase of Ba adsorption on Si(001)-2 × 1
- DOI 10.1016/S0039-6028(99)01079-1
- X. Hu, Surf. Sci. 0039-6028 445, 256 (2000). 10.1016/S0039-6028(99)01079- 1 (Pubitemid 30560110)
- (2000) Surface Science , vol.445 , Issue.2-3 , pp. 256-266
- Hu, X.¹ Yao, X.² Peterson, C.A.³ Sarid, D.⁴ Yu, Z.⁵ Wang, J.⁶ Marshall, D.S.⁷ Droopad, R.⁸ Hallmark, J.A.⁹ Ooms, W.J.¹⁰

12
- 0000506102
- 0163-1829,. 10.1103/PhysRevB.44.6534
- O. L. Alerhand, J. Wang, J. D. Joannopoulos, E. Kaxiras, and R. S. Becker, Phys. Rev. B 0163-1829 44, 6534 (1991). 10.1103/PhysRevB.44.6534
- (1991) Phys. Rev. B , vol.44 , pp. 6534
- Alerhand, O.L.¹ Wang, J.² Joannopoulos, J.D.³ Kaxiras, E.⁴ Becker, R.S.⁵

13
- 51649112452
- 0031-9007,. 10.1103/PhysRevLett.101.105503
- J. W. Reiner, K. F. Garrity, F. J. Walker, S. Ismail-Beigi, and C. H. Ahn, Phys. Rev. Lett. 0031-9007 101, 105503 (2008). 10.1103/PhysRevLett.101. 105503
- (2008) Phys. Rev. Lett. , vol.101 , pp. 105503
- Reiner, J.W.¹ Garrity, K.F.² Walker, F.J.³ Ismail-Beigi, S.⁴ Ahn, C.H.⁵

14
- 3342924439
- 0031-9007,. 10.1103/PhysRevLett.64.2406
- O. L. Alerhand, A. N. Berker, J. D. Joannopoulos, D. Vanderbilt, R. J. Hamers, and J. E. Demuth, Phys. Rev. Lett. 0031-9007 64, 2406 (1990). 10.1103/PhysRevLett.64.2406
- (1990) Phys. Rev. Lett. , vol.64 , pp. 2406
- Alerhand, O.L.¹ Berker, A.N.² Joannopoulos, J.D.³ Vanderbilt, D.⁴ Hamers, R.J.⁵ Demuth, J.E.⁶

15
- 0347746532
- 0034-6748,. 10.1063/1.1305512
- H. Hong, Z. Wu, T. -C. Chiang, P. Zschack, P. Jemian, H. Chen, and R. D. Aburano, Rev. Sci. Instrum. 0034-6748 71, 3132 (2000). 10.1063/1.1305512
- (2000) Rev. Sci. Instrum. , vol.71 , pp. 3132
- Hong, H.¹ Wu, Z.² Chiang, T.-C.³ Zschack, P.⁴ Jemian, P.⁵ Chen, H.⁶ Aburano, R.D.⁷

16
- 0001229872
- 0031-9007,. 10.1103/PhysRevLett.67.2818
- F. J. Walker, E. D. Specht, and R. A. McKee, Phys. Rev. Lett. 0031-9007 67, 2818 (1991). 10.1103/PhysRevLett.67.2818
- (1991) Phys. Rev. Lett. , vol.67 , pp. 2818
- Walker, F.J.¹ Specht, E.D.² McKee, R.A.³

17
- 0242523727
- 0163-1829,. 10.1103/PhysRevB.68.125323
- X. Zhang, A. A. Demkov, H. Li, X. Hu, Y. Wei, and J. Kulik, Phys. Rev. B 0163-1829 68, 125323 (2003). 10.1103/PhysRevB.68.125323
- (2003) Phys. Rev. B , vol.68 , pp. 125323
- Zhang, X.¹ Demkov, A.A.² Li, H.³ Hu, X.⁴ Wei, Y.⁵ Kulik, J.⁶

18
- 0027576643
- Method for the accurate determination of crystal truncation rod intensities by x-ray diffraction
- DOI 10.1107/S0021889892011592
- E. D. Specht and F. J. Walker, J. Appl. Crystallogr. 0021-8898 26, 166 (1993). 10.1107/S0021889892011592 (Pubitemid 23654642)
- (1993) Journal of Applied Crystallography , vol.26 , Issue.PART 2 , pp. 166-171
- Specht, E.D.¹ Walker, F.J.²

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