(3 × 2) phase of Ba adsorption on Si(001)-2 × 1

Surface Science

Volumn 445, Issue 2-3, 2000, Pages 256-266

  Hu, X ^a   Yao, X ^a   Peterson, C A ^a   Sarid, D ^a   Yu, Z ^b   Wang, J ^b   Marshall, D S ^b   Droopad, R ^b   Hallmark, J A ^b   Ooms, W J ^b  

^a UNIVERSITY OF ARIZONA   (United States)

^b MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ATOMS; AUGER ELECTRON SPECTROSCOPY; BARIUM; HIGH TEMPERATURE TESTING; LOW ENERGY ELECTRON DIFFRACTION; MATHEMATICAL MODELS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; X RAY PHOTOELECTRON SPECTROSCOPY;

ATOMIC CHAINS; ULTRA HIGH VACUUM SCANNING TUNNELING MICROSCOPY;

SURFACE STRUCTURE;

EID: 0033893350     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)01079-1     Document Type: Article

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