Identification of nucleation center sites in thermally annealed hydrogenated amorphous silicon

Advanced Functional Materials

Volumn 19, Issue 14, 2009, Pages 2338-2344

  Mahan, A Harv ^a   Su, Timing ^b   Williamson, Don L ^b   Gedvilas, Lynn M ^a   Ahrenkiel, S Phil ^c   Parilla, Phillip A ^a   Xu, Yueqin ^a   Ginley, David A ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^b Department of Metallurgical and Materials Engineering   (United States)

^c SOUTH DAKOTA SCHOOL OF MINES AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AS-GROWN FILMS; CRYSTALLIZATION PROCESS; FILM DEFECTS; FILM INHOMOGENEITY; H NMR SPECTROSCOPY; HYDROGENATED AMORPHOUS SILICON; INCUBATION TIME; MICROVOID; NUCLEATION CENTER; PHASE TRANSFORMATION; SHORT RANGE ORDERS; SPATIAL REGIONS; TYPE STRUCTURES;

AMORPHOUS SILICON; ANNEALING; CRYSTALLITE SIZE; CRYSTALLIZATION; DANGLING BONDS; HYDROGENATION; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; NUCLEATION;

AMORPHOUS FILMS;

EID: 67651233435     PISSN: 1616301X     EISSN: 16163028     Source Type: Journal    
DOI: 10.1002/adfm.200801709     Document Type: Article

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