Annealing and recrystallization of hydrogenated amorphous silicon

Physical Review B - Condensed Matter and Materials Physics

Volumn 64, Issue 7, 2001, Pages

  Britton, D T ^a   Hempel, A ^a   Harting M ^a   Kogel G ^b   Sperr, P ^b   Triftshauser W ^b   Arendse, C ^c   Knoesen, D ^c  

^a UNIVERSITY OF CAPE TOWN   (South Africa)

^b BUNDESWEHR UNIVERSITY MUNICH   (Germany)

^c UNIVERSITY OF THE WESTERN CAPE   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ARTICLE; CRYSTAL STRUCTURE; CRYSTALLIZATION; DRY DEPOSITION; HYDROGEN BOND; MOLECULAR MODEL; POSITRON; SPECTROSCOPY; SYSTEM ANALYSIS; X RAY DIFFRACTION;

EID: 0035881382     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.64.075403     Document Type: Article

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