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Volumn 516, Issue 5, 2008, Pages 529-532
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A comparison of grain nucleation and grain growth during crystallization of HWCVD and PECVD a-Si:H films
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Author keywords
Annealing; Crystallite nucleation; Crystallization kinetics; Hydrogenated amorphous silicon; Nuclear magnetic resonance
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Indexed keywords
AMORPHOUS SILICON;
ANNEALING;
CHEMICAL VAPOR DEPOSITION;
CRYSTALLIZATION KINETICS;
GRAIN GROWTH;
MATHEMATICAL MODELS;
NUCLEAR MAGNETIC RESONANCE;
CRYSTALLITE NUCLEATION;
HYDROGEN CONTENTS;
THIN FILMS;
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EID: 36749052233
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2007.06.036 Document Type: Article |
Times cited : (28)
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References (22)
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