A new and efficient approach for estimating the accurate time-domain response of single and capacitive coupled distributed RC interconnects

Microelectronics Journal

Volumn 40, Issue 8, 2009, Pages 1212-1224

  Masoumi, Massoud ^a   Masoumi, Nasser ^a   Javanpak, Amir ^a  

^a Center of Excellence in Geomatics Engineering and Disaster Prevention   (Iran)

Author keywords

Artificial neural network (ANN); Capacitive coupled lines; Coupling noise; Diffusion equation; Distributed RC interconnects; Signal integrity; Very large scale integration (VLSI)

Indexed keywords

ARTIFICIAL NEURAL NETWORK (ANN); CAPACITIVE COUPLED LINES; COUPLING NOISE; DIFFUSION EQUATION; DISTRIBUTED RC INTERCONNECTS; SIGNAL INTEGRITY; VERY LARGE SCALE INTEGRATION (VLSI);

BACKPROPAGATION; COMPUTER AIDED DESIGN; CROSSTALK; ELECTRIC LINES; ELECTRIC POTENTIAL; ESTIMATION; NEURAL NETWORKS; QUALITY ASSURANCE; SIGNAL PROCESSING; SIMULATORS; TIME DOMAIN ANALYSIS; VLSI CIRCUITS;

CIRCUIT SIMULATION;

EID: 67651163416     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mejo.2009.04.004     Document Type: Article

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