-
1
-
-
0029290956
-
Fatigue-Free Ferroelectric Capacitors with Platinum Electrodes
-
C. A. Paz de Araujo, J. D. Cuchiaro, L. D. McMillan, M. C. Scott J. F. Scott Fatigue-Free Ferroelectric Capacitors with Platinum Electrodes Nature (London), 374, 627 9 (1995).
-
(1995)
Nature (London)
, vol.374
, pp. 627-9
-
-
Paz De Araujo, C.A.1
Cuchiaro, J.D.2
McMillan, L.D.3
Scott, M.C.4
Scott, J.F.5
-
2
-
-
0033554712
-
Lanthanum-Substituted Bismuth Titanate for Use in Non-Volatile Memories
-
B. H. Park, B. S. Kang, S. D. Bu, T. W. Noh, J. Lee W. Jo Lanthanum-Substituted Bismuth Titanate for Use in Non-Volatile Memories Nature (London), 401, 682 4 (1999).
-
(1999)
Nature (London)
, vol.401
, pp. 682-4
-
-
Park, B.H.1
Kang, B.S.2
Bu, S.D.3
Noh, T.W.4
Lee, J.5
Jo, W.6
-
4
-
-
79956055074
-
12-Based Thin Films with Long-Range Lattice Matching
-
12-Based Thin Films with Long-Range Lattice Matching Appl. Phys. Lett., 81, 1660 2 (2002).
-
(2002)
Appl. Phys. Lett.
, vol.81
, pp. 1660-2
-
-
Watanabe, T.1
Funakubo, H.2
Saito, K.3
Suzuki, T.4
Fujimoto, M.5
Osada, M.6
Noguchi, Y.7
Miyayama, M.8
-
7
-
-
0142058395
-
12 Films
-
12 Films Appl. Phys. Lett., 83, 2414 6 (2003).
-
(2003)
Appl. Phys. Lett.
, vol.83
, pp. 2414-6
-
-
Garg, A.1
Snedden, A.2
Lightfoot, P.3
Dawber, M.4
Scott, J.F.5
Barber, Z.H.6
-
8
-
-
33747127837
-
2/Si
-
1-3
-
2/Si Appl. Phys. Lett., 89, 062905 1-3 (2006).
-
(2006)
Appl. Phys. Lett.
, vol.89
, pp. 062905
-
-
Lu, C.J.1
Liu, X.L.2
Chen, X.Q.3
Nie, C.J.4
Le Rhun, G.5
Senz, S.6
Hesse, D.7
-
9
-
-
33751084562
-
2/Si Substrates
-
2/Si Substrates J. Appl. Phys., 100, 096109 1-3 (2006).
-
(2006)
J. Appl. Phys.
, vol.100
, Issue.13
, pp. 096109
-
-
Hu, G.D.1
-
12
-
-
0038662918
-
Growth of Uniformly a-Axis-Oriented Ferroelectric Lanthanum-Substituted Bismuth Titanate Films on Silicon Substrates
-
H. N. Lee, D. Hesse, N. Zakharov, S. K. Lee U. Gösele Growth of Uniformly a-Axis-Oriented Ferroelectric Lanthanum-Substituted Bismuth Titanate Films on Silicon Substrates J. Appl. Phys., 93, 5592 601 (2003).
-
(2003)
J. Appl. Phys.
, vol.93
, pp. 5592-601
-
-
Lee, H.N.1
Hesse, D.2
Zakharov, N.3
Lee, S.K.4
Gösele, U.5
-
13
-
-
33747127837
-
2/Si
-
2/Si Appl. Phys. Lett., 89, 062905 1-3 (2006).
-
(2006)
Appl. Phys. Lett.
, vol.89
, Issue.13
, pp. 062905
-
-
Lu, C.J.1
Liu, X.L.2
Chen, X.Q.3
Nie, C.J.4
Le Rhun, G.5
Senz, S.6
Hesse, D.7
-
15
-
-
33947324998
-
Probing Intrinsic Polarization Properties in Bismuth-Layered Ferroelectric Films
-
T. Watanabe, H. Funakubo, H. Uchida, I. Okada, B. J. Rodriguez A. Gruverman Probing Intrinsic Polarization Properties in Bismuth-Layered Ferroelectric Films Appl. Phys. Lett., 90, 112914 1-3 (2007).
-
(2007)
Appl. Phys. Lett.
, vol.90
, Issue.13
, pp. 112914
-
-
Watanabe, T.1
Funakubo, H.2
Uchida, H.3
Okada, I.4
Rodriguez, B.J.5
Gruverman, A.6
-
16
-
-
0032620498
-
9 Thin Films Prepared by the Metalorganic Decomposition
-
9 Thin Films Prepared by the Metalorganic Decomposition Appl. Phys. Lett., 74, 3711 3 (1999).
-
(1999)
Appl. Phys. Lett.
, vol.74
, pp. 3711-3
-
-
Hu, G.D.1
Xu, J.B.2
Wilson, I.H.3
Cheung, W.Y.4
Ke, N.5
Wong, S.P.6
-
17
-
-
40849097810
-
2/Si Substrates
-
2/Si Substrates J. Appl. Phys., 103, 056109 1-3 (2008).
-
(2008)
J. Appl. Phys.
, vol.103
, Issue.13
, pp. 056109
-
-
Yan, J.1
Hu, G.2
Liu, Z.3
Fan, S.4
Zhou, Y.5
Yang, C.6
Wu, W.7
-
18
-
-
2942611255
-
15 Films
-
15 Films Appl. Phys. Lett., 84, 3771 3 (2004).
-
(2004)
Appl. Phys. Lett.
, vol.84
, pp. 3771-3
-
-
Kato, K.1
Fu, D.2
Suzuki, K.3
Tanaka, K.4
Nishizawa, K.5
Miki, T.6
-
19
-
-
58149308631
-
12-Buffered Indium Tin Oxide/Si Substrate
-
12-Buffered Indium Tin Oxide/Si Substrate J. Phys. D., 41, 225402 1-5 (2008).
-
(2008)
J. Phys. D.
, vol.41
, Issue.15
, pp. 225402
-
-
Chen, X.M.1
Hu, G.D.2
Yan, J.3
Wang, X.4
Yang, C.H.5
Wu, W.B.6
-
21
-
-
0742268446
-
Stress Effects in Sol-Gel Derived Ferroelectric Thin Films
-
L. Lian N. R. Sottos Stress Effects in Sol-Gel Derived Ferroelectric Thin Films J. Appl. Phys., 95, 629 34 (2004).
-
(2004)
J. Appl. Phys.
, vol.95
, pp. 629-34
-
-
Lian, L.1
Sottos, N.R.2
-
22
-
-
33645229380
-
3 Crystals: Implication for a Unified Microscopic Explanation of Ferroelectric Aging
-
3 Crystals: Implication for a Unified Microscopic Explanation of Ferroelectric Aging Phys. Rev. B, 73, 094121 1-6 (2006).
-
(2006)
Phys. Rev. B
, vol.73
, Issue.16
, pp. 094121
-
-
Zhang, L.1
Ren, X.2
|