Probing intrinsic polarization properties in bismuth-layered ferroelectric films

Applied Physics Letters

Volumn 90, Issue 11, 2007, Pages

  Watanabe, Takayuki ^a,e   Funakubo, Hiroshi ^a   Osada, Minoru ^b   Uchida, Hiroshi ^c   Okada, Isao ^c   Rodriguez, Brian J ^d,f   Gruverman, Alexei ^d  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^c SOPHIA UNIVERSITY   (Japan)

^d North Carolina State University   (United States)

^e FORSCHUNGSZENTRUM JÜLICH   (Germany)

^f OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH-LAYERED FERROELECTRIC FILMS; INTRINSIC POLARIZATION STATES; PIEZOELECTRIC COEFFICIENTS;

BISMUTH COMPOUNDS; ELECTRIC FIELD EFFECTS; EPITAXIAL GROWTH; HYSTERESIS LOOPS; PIEZOELECTRICITY; SPECTROSCOPIC ANALYSIS;

FERROELECTRIC THIN FILMS;

EID: 33947324998     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2713858     Document Type: Article

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