Orientation dependence of ferroelectric and piezoelectric properties of Bi3.15Nd0.85Ti3O12 thin films on Pt(100)/TiO2SiO2Si substrates

Journal of Applied Physics

Volumn 100, Issue 9, 2006, Pages

  Hu, G D ^a  

^a UNIVERSITY OF JINAN   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BISMUTH COMPOUNDS; CRYSTALLINE MATERIALS; FERROELECTRICITY; PIEZOELECTRICITY; PLATINUM; REMANENCE; SILICA; TITANIUM OXIDES;

FERROELECTRIC PROPERTIES; METAL ORGANIC DECOMPOSITION; PIEZOELECTRIC PROPERTIES; POLARIZATION VECTOR;

THIN FILMS;

EID: 33751084562     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2364668     Document Type: Article

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