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Journal of Applied Physics

Volumn 105, Issue 1, 2009, Pages

Effect of thermal vibrations on the resonant frequency of cantilever for scanning thermal microscopy nanomachining

(3) Lee, Haw Long a Fang, Te Hua b Chang, Win Jin a

a KUN SHAN UNIVERSITY (Taiwan)

b NATIONAL FORMOSA UNIVERSITY (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL EXPRESSIONS; CANTILEVER PROBE; EULER BEAM; FLEXURAL VIBRATIONS; HIGHER MODE; LENGTH-TO-THICKNESS RATIO; MACHINED SURFACE; MODAL FREQUENCY; MODE SHAPES; NANOMACHINING; OPERATING TEMPERATURE; RESONANT FREQUENCIES; ROTARY INERTIAS; SCANNING THERMAL MICROSCOPE; SCANNING THERMAL MICROSCOPY; THERMAL VIBRATION; TIMOSHENKO BEAM MODEL; VIBRATION MODES;

ATOMIC FORCE MICROSCOPY; EARTHQUAKE RESISTANCE; NANOCANTILEVERS; NATURAL FREQUENCIES; PARTICLE BEAMS; PROBES; SCANNING; VIBRATING CONVEYORS;

VIBRATORS;

EID: 67649791087 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3031761 Document Type: Article

Times cited : (6)

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