Local thermal property analysis by scanning thermal microscope of ultrafine-grained surface layer in copper and in titanium produced by surface mechanical attrition treatment

Materials Characterization

Volumn 58, Issue 7, 2007, Pages 658-665

  Guo, F A ^a   Ji, Y L ^a   Zhang, Y N ^a   Trannoy, N ^b  

^a Suzhou Institute for Nonferrous Metals Processing Technology   (China)

^b UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

Author keywords

SMAT; SThM; Thermal conductivity; Ultrafine grained microstructure

Indexed keywords

COPPER; MICROSTRUCTURE; THERMAL CONDUCTIVITY; TITANIUM;

SCANNING THERMAL MICROSCOPES; SURFACE LAYERS; SURFACE MECHANICAL ATTRITION TREATMENT (SMAT); ULTRAFINE-GRAINED MICROSTRUCTURE;

SURFACE TREATMENT;

EID: 34248150028     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2006.08.010     Document Type: Article

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