Thickness dependent physical properties of close space evaporated In2S3 films

Solid State Sciences

Volumn 11, Issue 7, 2009, Pages 1288-1296

  Revathi, N ^a   Prathap, P ^b   Reddy, K T Ramakrishna ^a  

^a SRI VENKATESWARA UNIVERSITY   (India)

^b Faculté de Médecine   (France)

Author keywords

In2S3 thin films; Optical properties; Structural and morphological properties

Indexed keywords

AS-GROWN; BAND GAPS; CORNING GLASS; CRYSTALLOGRAPHIC ORIENTATIONS; DEPOSITED FILMS; ELECTRICAL RESISTIVITY; EXTINCTION COEFFICIENTS; HETEROJUNCTION SOLAR CELLS; IN2S3 THIN FILMS; MIXED PHASIS; OPTICAL AND ELECTRICAL PROPERTIES; OPTICAL TRANSMITTANCE; PHYSICAL CHARACTERISTICS; POLYCRYSTALLINE; STRUCTURAL AND MORPHOLOGICAL PROPERTIES; SUBSTRATE TEMPERATURE; TETRAGONAL PHASE; TETRAGONAL STRUCTURE; WAVELENGTH RANGES;

ACTIVATION ENERGY; CRYSTALLITE SIZE; ELECTRIC PROPERTIES; ELECTRIC RESISTANCE; FILM THICKNESS; MAGNETIC FILMS; MOLECULAR BEAM EPITAXY; OPACITY; OPTICAL CONSTANTS; REFRACTIVE INDEX; SOLAR ENERGY; STRUCTURAL PROPERTIES; SUBSTRATES; SURFACE ROUGHNESS; THIN FILMS;

OPTICAL FILMS;

EID: 67349119805     PISSN: 12932558     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solidstatesciences.2009.04.019     Document Type: Article

References (54)

1. Tenne R., Nabutovsky V.M., Lifshitz E., and Francis A.F. Solid State Commun. 82 (1992) 651
2. Ruxandra V., and Antohe S. J. Appl. Phys. 84 (1998) 727
3. Su B., and Choy K.L. Thin Solid Films 361 (2000) 102
4. Kostoglu M., Andritos N., and Karabelas A.J. Thin Solid Films 387 (2001) 115
5. Nemec P., Nemec I., Nahalkova P., Knizek K., and Maly P. J. Cryst. Growth 240 (2002) 484
6. John T.T., Bini S., Kashiwaba Y., Abe T., Yasuhiro Y., Sudha Kartha C., and Vijaya Kumar K.P. Semicond. Sci. Technol. 18 (2003) 491
7. Herrero J., and Ortega J. Sol. Energy Mater. 17 (1988) 357
8. Nomura R., Inazawa S., Kanaya K., and Matsuda H. Appl. Organomet. Chem. 3 (1989) 195
9. Diehl R., and Nitsche R. J. Cryst. Growth 28 (1975) 306
10. Yu S., Shu L., Qian Y., Xie Y., Yang J., and Yang L. Mater. Res. Bull. 33 (1998) 717
11. Dalas E., and Kobotiatis L. J. Mater. Sci. 28 (1993) 6595
12. Mane R.S., and Lokhande C.D. Mater. Chem. Phys. 78 (2002) 15
13. Luh D.A., Miller T., Paggel J.J., and Chiang T.C. Phys. Rev. Lett. 88 (2002) 256802
14. Lai F., Li M., Wang H., Hu H., Wang X., Hou J.G., Song Y., and Jiang Y. Thin Solid Films 488 (2005) 314
15. Bruggemann R., Reinig P., and Holling M. Thin Solid Films 427 (2003) 358
16. Kim H., Horwitz J.S., Kushto G., Pique A., Karafi Z.H., and Gilmore C.M. J. Appl. Phys. 88 (2000) 6021
17. Qiao Z., Latz R., and Mergel D. Thin Solid Films 466 (2004) 250
18. Revathi N., Prathap P., and Reddy K.T.R. Appl. Surf. Sci. 254 (2008) 5291
19. Subbaiah Y.P.V., Prathap P., Devika M., and Reddy K.T.R. Physica B 365 (2005) 240
20. Yu S.H., Shu L., Wu Y.S., Yang J., Xie Y., and Qian Y.T. J. Am. Ceram. Soc. 82 (1999) 457
21. Ritter E., and Hoffman R. J. Vac. Sci. Technol. 6 (1969) 733
22. Patel S.M., and Kapale V.G. Mater. Lett. 3 (1985) 440
23. Maiti B., Gupta P., Chaudhuri S., and Pal A.K. Thin Solid Films 239 (1994) 104
24. Sandoval-Paz M.G., Sotelo-Lerma M., Valenzuela-Jauregui J.J., Flores-Acosta M., and Ramirez-Bon R. Thin Solid Films 472 (2005) 5
25. Trofimov V.I., Trofimov I.V., and Kim II J. Thin Solid Films 495 (2006) 398
26. Mergel D., Stass W., Ehl G., and Barthel D. J. Appl. Phys. 88 (2000) 2437
27. Chopra K.L. Thin Film Phenomena (1969), McGraw-Hill, New York
28. Zavrazhnov A.Yu., Naumov A.V., Anorov P.V., Goncharov E.G., Sidei V.I., and Pervov V.S. Inorg. Mater. 42 (2006) 1294
29. Kim W., and Kim C. J. Appl. Phys. 60 (1986) 2631
30. Barret C., and Massalaski T.B. Structure of Metals (1980), Pergmon, Oxford p. 204
31. Moutinho H.R., Hasoon F.S., Abulfotuh F., and Kazmerski L.L. J. Vac. Sci. Technol. A 13 (1995) 2877
32. Kim K.H., and Chun J.S. Thin Solid Films 141 (1986) 287
33. Lee D.N. Thin Solid Films 434 (2003) 183
34. Savaloni H., and Kangarloo H. J. Phys. D: Appl. Phys. 40 (2007) 203
35. Ong H.C., Zhu A.X.E., and Du G.T. Appl. Phys. Lett. 80 (2002) 941
36. Tu K.N., Mayer J.W., and Feldman L.C. Electronic Thin Film Science for Electrical Engineers and Materials Scientists (1992), Macmillan, New York (Chapter 7), p. 161
37. Ghosh R., Basak D., and Fujihara S. J. Appl. Phys. 96 (2004) 2689
38. Warren B.E. X-ray Diffraction (1990), Dover, New York p. 253
39. Guillen C., Garcia T., Herrero J., Gutierrez M.T., and Briones F. Thin Solid Films 451-452 (2004) 112
40. Ramirez R., Sandoval N.C., Espinoza F.J., Sotelo M., Zelaya O., and Falcony C. J. Phys. Cond. Matter 9 (1997) 10051
41. Meng L.J., Gao J., dos Santos M.P., Wang X., and Wang T. Thin Solid Films 516 (2008) 1365
42. Tong X.L., Jiang D.S., Li Y., Liu Z.M., and Luo Z.M. Physica B 382 (2006) 105
43. Liu Y.C., Tung S.K., and Hsieh J.H. J. Cryst. Growth 287 (2006) 105
44. Lin S.S., and Huang J.L. Surf. Coat. Technol. 185 (2004) 222
45. Lokhande C.D., Ubale A.U., and Patil P.S. Thin Solid Films 302 (1997) 1
46. Mane R.S., and Lokhande C.D. Mater. Chem. Phys. 82 (2003) 347
47. Dow J.D., and Redfield D. Phys. Rev. B 5 (1972) 594
48. Hao X.T., Ma J., Zhang D.H., yang T.L., Ma H.L., Yang Y.G., Cheng C.F., and Huang J. Appl. Surf. Sci. 183 (2001) 137
49. Swanepoel R. Phys. E: Sci. Instrum. 16 (1983) 1214
50. Samantha B., Sharma S.L., and Chaudhuri A.K. Indian J. Pure Appl. Phys. 32 (1994) 62
51. Gupta V., and Mansingh A. J. Appl. Phys. 80 (1996) 1063
52. Modreanu M., Gartner M., Tomozeiu N., and Szekeres A. J. Optoelectron. Adv. Mater. 3 (2001) 575
53. Seto J.Y.W. J. Appl. Phys. 46 (1975) 5247
54. Paul D.K., and Mitra S.S. Phys. Rev. 34 (1973) 1000