Thickness dependent properties of chemically deposited Bi2S3 thin films

Thin Solid Films

Volumn 302, Issue 1-2, 1997, Pages 1-4

  Lokhande, C D ^a,b   Ubale, A U ^a   Patil, P S ^a  

^a SHIVAJI UNIVERSITY   (India)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

Bismuth sulphide; Electrical properties and measurements; Nanostructures; Optical properties

Indexed keywords

ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC CONDUCTIVITY OF SOLIDS; ENERGY GAP; FILM PREPARATION; GRAIN SIZE AND SHAPE; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; SEMICONDUCTING BISMUTH COMPOUNDS; SULFUR COMPOUNDS; THIN FILMS;

BISMUTH SULFIDE; QUANTUM SIZE EFFECT; THIOSULFATE;

SEMICONDUCTING FILMS;

EID: 0031168735     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)09540-5     Document Type: Article

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